Jorgen W. Andersen

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Orlando, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Time domain delay device measurement apparatus including sensor pac...
- Patent number 5,831,167
- Issue date Nov 3, 1998
- Sawtek Inc.
- Jorgen W. Andersen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and associated method for measuring differences in delay...
- Patent number 5,804,729
- Issue date Sep 8, 1998
- Sawtek Inc.
- Jorgen W. Andersen
- G01 - MEASURING TESTING
Information Patent Grant
Time domain delay measurement apparatus and associated method
- Patent number 5,700,952
- Issue date Dec 23, 1997
- Sawtek Inc.
- Jorgen W. Andersen
- G01 - MEASURING TESTING