Jose Arturo Garza

Person

Pflugerville, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,479,796
- Issue date Jan 20, 2009
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,466,155
- Issue date Dec 16, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,463,017
- Issue date Dec 9, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,456,644
- Issue date Nov 25, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,453,279
- Issue date Nov 18, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,425,822
- Issue date Sep 16, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,423,440
- Issue date Sep 9, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,405,583
- Issue date Jul 29, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Functional and stress testing of LGA devices
- Patent number 7,352,200
- Issue date Apr 1, 2008
- International Business Machines Corporation
- John Saunders Corbin, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for functional and stress testing of exposed chip land gr...
- Patent number 6,911,836
- Issue date Jun 28, 2005
- International Business Machines Corporation
- Lonnie J. Cannon
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing land grid array modules
- Patent number 6,765,397
- Issue date Jul 20, 2004
- International Business Machines Corporation
- John S. Corbin
- G01 - MEASURING TESTING
Information Patent Grant
Heatsink retention and air duct assembly
- Patent number 5,910,884
- Issue date Jun 8, 1999
- International Business Machines Corporation
- Jose Arturo Garza
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070210819
- Publication date Sep 13, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205796
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205756
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205758
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205757
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205773
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205797
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
- Publication number 20070205786
- Publication date Sep 6, 2007
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
Functional and stress testing of LGA devices
- Publication number 20060152237
- Publication date Jul 13, 2006
- John Saunders Corbin
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for functional and stress testing of exposed chip land gr...
- Publication number 20050040838
- Publication date Feb 24, 2005
- International Business Machines Corporation
- Lonnie J. Cannon
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING LAND GRID ARRAY MODULES
- Publication number 20040113638
- Publication date Jun 17, 2004
- International Business Machines Corporation
- John S. Corbin,
- G01 - MEASURING TESTING

Jose Arturo Garza

Person

Patents Grantslast 30 patents

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Functional and stress testing of LGA devices

Apparatus for functional and stress testing of exposed chip land gr...

Apparatus and method for testing land grid array modules

Heatsink retention and air duct assembly

Patents Applicationslast 30 patents

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

FUNCTIONAL AND STRESS TESTING OF LGA DEVICES

Functional and stress testing of LGA devices

Apparatus for functional and stress testing of exposed chip land gr...

APPARATUS AND METHOD FOR TESTING LAND GRID ARRAY MODULES