Jose Marcos Laraia

Person

Pocatello, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Providing nonlinear temperature compensation for sensing means by u...
- Patent number 7,991,571
- Issue date Aug 2, 2011
- Semiconductor Components Industries, LLC
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Padé approximant based compensation for integrated sensor modules a...
- Patent number 7,944,214
- Issue date May 17, 2011
- Semiconductor Components Industries, LLC
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Pade' approximant based compensation for integrated sensor modules...
- Patent number 7,859,269
- Issue date Dec 28, 2010
- Semiconductor Components Industries, LLC
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Providing nonlinear temperature compensation for sensing means by u...
- Patent number 7,398,173
- Issue date Jul 8, 2008
- AMI Semiconductor, Inc.
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Padé approximant based compensation for integrated sensor modules a...
- Patent number 7,378,858
- Issue date May 27, 2008
- AMI Semiconductor, Inc.
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Pade′ Approximant based compensation for integrated sensor modules...
- Patent number 7,190,178
- Issue date Mar 13, 2007
- AMI Semiconductor, Inc.
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Reactive sensor modules using Pade' Approximant based compensation...
- Patent number 7,006,938
- Issue date Feb 28, 2006
- AMI Semiconductor, Inc.
- Jose Marcos Laraia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PADE' APPROXIMANT BASED COMPENSATION FOR INTEGRATED SENSOR MODULES...
- Publication number 20110057709
- Publication date Mar 10, 2011
- Semiconductor Components Industries, LLC
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Application
Providing Nonlinear Temperature Compensation for Sensing Means by U...
- Publication number 20080270062
- Publication date Oct 30, 2008
- Jose Marcos LARAIA
- G01 - MEASURING TESTING
Information Patent Application
Pade' approximant based compensation for integrated sensor modules...
- Publication number 20070132462
- Publication date Jun 14, 2007
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Application
Providing nonlinear temperature compensation for sensing means by u...
- Publication number 20060265167
- Publication date Nov 23, 2006
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Application
REACTIVE SENSOR MODULES USING PADE' APPROXIMANT BASED COMPENSATION...
- Publication number 20050283330
- Publication date Dec 22, 2005
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Application
Pade' approximant based compensation for integrated sensor modules...
- Publication number 20050256660
- Publication date Nov 17, 2005
- AMI Semiconductor, Inc.
- Jose Marcos Laraia
- G01 - MEASURING TESTING

Jose Marcos Laraia

Person

Patents Grantslast 30 patents

Providing nonlinear temperature compensation for sensing means by u...

Padé approximant based compensation for integrated sensor modules a...

Pade' approximant based compensation for integrated sensor modules...

Providing nonlinear temperature compensation for sensing means by u...

Padé approximant based compensation for integrated sensor modules a...

Pade′ Approximant based compensation for integrated sensor modules...

Reactive sensor modules using Pade' Approximant based compensation...

Patents Applicationslast 30 patents

PADE' APPROXIMANT BASED COMPENSATION FOR INTEGRATED SENSOR MODULES...

Providing Nonlinear Temperature Compensation for Sensing Means by U...

Pade' approximant based compensation for integrated sensor modules...

Providing nonlinear temperature compensation for sensing means by u...

REACTIVE SENSOR MODULES USING PADE' APPROXIMANT BASED COMPENSATION...

Pade' approximant based compensation for integrated sensor modules...