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Josef Fazekas
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Munchen, DE
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Patents Grants
last 30 patents
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Patent Grant
Method for detecting the reliability of integrated semiconductor co...
Patent number
6,873,170
Issue date
Mar 29, 2005
Infineon Technologies AG
Wilhelm Asam
G01 - MEASURING TESTING
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Patent Grant
Device and method for detecting a reliability of integrated semicon...
Patent number
6,787,799
Issue date
Sep 7, 2004
Infineon Technologies AG
Wilhelm Asam
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for detecting the reliability of integrated semiconductor co...
Publication number
20040140826
Publication date
Jul 22, 2004
Infineon Technologies AG
Wilhelm Asam
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Electromigration test structure for detecting the reliability of wi...
Publication number
20040036495
Publication date
Feb 26, 2004
Josef Fazekas
G01 - MEASURING TESTING
Information
Patent Application
Device and method for detecting a reliability of integrated semicon...
Publication number
20030020131
Publication date
Jan 30, 2003
Wilhelm Asam
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device, semiconductor test structure and method for f...
Publication number
20030006412
Publication date
Jan 9, 2003
Andreas Martin
H01 - BASIC ELECTRIC ELEMENTS