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Josef Heinisch
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Wedel, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Device for measuring an imaging property of an optical system
Patent number
10,386,267
Issue date
Aug 20, 2019
Trioptics GmbH
Josef Heinisch
G01 - MEASURING TESTING
Information
Patent Grant
Measurement of the positions of centres of curvature of optical sur...
Patent number
8,913,234
Issue date
Dec 16, 2014
Trioptics GmbH
Josef Heinisch
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring spacings between optical surface...
Patent number
8,760,666
Issue date
Jun 24, 2014
Trioptics GmbH
Josef Heinisch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEASURING APPARATUS AND METHOD FOR MEASURING A MODULATION TRANSFER...
Publication number
20240085271
Publication date
Mar 14, 2024
Trioptics GmbH
Josef HEINISCH
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR MEASURING AN IMAGING PROPERTY OF AN OPTICAL SYSTEM
Publication number
20180136079
Publication date
May 17, 2018
Trioptics GmbH
Josef Heinisch
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Measuring Spacings Between Optical Surface...
Publication number
20120133951
Publication date
May 31, 2012
Trioptics GmnH
Josef Heinisch
G01 - MEASURING TESTING
Information
Patent Application
Measurement of the Positions of Centres of Curvature of Optical Sur...
Publication number
20120133924
Publication date
May 31, 2012
Trioptics GmbH
Josef Heinisch
G01 - MEASURING TESTING