Josef L. Mader

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Bend, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus having improved sample density using nested d...
- Patent number 5,148,230
- Issue date Sep 15, 1992
- Tektronix, Inc.
- Richard I. Lane
- G01 - MEASURING TESTING
Information Patent Grant
Expansion windowing system for a measurement test instrument
- Patent number 5,129,722
- Issue date Jul 14, 1992
- Tektronix, Inc.
- Josef L. Mader
- G06 - COMPUTING CALCULATING COUNTING