Josef Schmid

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Neumarkt, DE

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Patents Applicationslast 30 patents

Information Patent Application
Delayed flash clear scan flip-flop to be implemented in complex int...
- Publication number 20030034795
- Publication date Feb 20, 2003
- Klaus-Holger Otto
- G01 - MEASURING TESTING
Information Patent Application
Boundary scan delay chain for cross-chip delay measurement
- Publication number 20020116674
- Publication date Aug 22, 2002
- Josef Schmid
- G01 - MEASURING TESTING