Josef Weidmann

Person

Altenmarkt, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for machining a scale
- Patent number 10,222,192
- Issue date Mar 5, 2019
- Dr. Johannes Heidenhain GmbH
- Moritz Schwabe
- B24 - GRINDING POLISHING
Information Patent Grant
Optical position-measuring device having grating fields with differ...
- Patent number 10,119,802
- Issue date Nov 6, 2018
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device
- Patent number 9,677,874
- Issue date Jun 13, 2017
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Measuring graduation and photoelectric position measuring device ha...
- Patent number 9,453,744
- Issue date Sep 27, 2016
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Grant
Assembly comprising a measuring scale attached to a substrate and m...
- Patent number 8,650,769
- Issue date Feb 18, 2014
- Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement with a scale fastened on a support
- Patent number 8,234,793
- Issue date Aug 7, 2012
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Grant
Scanning head for optical position-measuring systems
- Patent number 7,719,075
- Issue date May 18, 2010
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Method for attaching a scale to a carrier, a scale, and carrier hav...
- Patent number 7,707,739
- Issue date May 4, 2010
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometer and method for manufacturing a reflectometer
- Patent number 6,961,174
- Issue date Nov 1, 2005
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Grant
Material measure and position measuring device comprising such a ma...
- Patent number 6,844,558
- Issue date Jan 18, 2005
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MACHINING A SCALE
- Publication number 20170211920
- Publication date Jul 27, 2017
- Dr. Johannes Heidenhain Gmbh
- Moritz Schwabe
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POSITION-MEASURING DEVICE
- Publication number 20170211923
- Publication date Jul 27, 2017
- Dr. Johannes Heidenhain Gmbh
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Application
POSITION-MEASURING DEVICE
- Publication number 20160216103
- Publication date Jul 28, 2016
- Dr. Johannes Heidenhain Gmbh
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Application
MEASURING GRADUATION AND PHOTOELECTRIC POSITION MEASURING DEVICE HA...
- Publication number 20150098094
- Publication date Apr 9, 2015
- Dr. Johannes Heidenhain Gmbh
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Application
Assembly Comprising a Measuring Scale Attached to a Substrate and M...
- Publication number 20120023769
- Publication date Feb 2, 2012
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Application
Arrangement with a scale fastened on a support
- Publication number 20110119945
- Publication date May 26, 2011
- Dr. Johannes Heidenhain GmbH
- Josef Weidmann
- G01 - MEASURING TESTING
Information Patent Application
Scanning Head for Optical Position-Measuring Systems
- Publication number 20070278486
- Publication date Dec 6, 2007
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Application
Method for attaching a scale to a carrier, a scale, and carrier hav...
- Publication number 20070137059
- Publication date Jun 21, 2007
- Wolfgang Holzapfel
- G01 - MEASURING TESTING

Josef Weidmann

Person

Patents Grantslast 30 patents

Method for machining a scale

Optical position-measuring device having grating fields with differ...

Position-measuring device

Measuring graduation and photoelectric position measuring device ha...

Assembly comprising a measuring scale attached to a substrate and m...

Arrangement with a scale fastened on a support

Scanning head for optical position-measuring systems

Method for attaching a scale to a carrier, a scale, and carrier hav...

Reflectometer and method for manufacturing a reflectometer

Material measure and position measuring device comprising such a ma...

Patents Applicationslast 30 patents

METHOD FOR MACHINING A SCALE

OPTICAL POSITION-MEASURING DEVICE

POSITION-MEASURING DEVICE

MEASURING GRADUATION AND PHOTOELECTRIC POSITION MEASURING DEVICE HA...

Assembly Comprising a Measuring Scale Attached to a Substrate and M...

Arrangement with a scale fastened on a support

Scanning Head for Optical Position-Measuring Systems

Method for attaching a scale to a carrier, a scale, and carrier hav...