Joseph D. Clark

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Litchfield, NH, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated photodetector with charge storage bin of varied detectio...
- Patent number 12,123,772
- Issue date Oct 22, 2024
- Quantum-Si Incorporated
- Thomas Raymond Thurston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data acquisition control for advanced analytic instruments having p...
- Patent number 11,808,700
- Issue date Nov 7, 2023
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated photodetector with charge storage bin of varied detectio...
- Patent number 11,391,626
- Issue date Jul 19, 2022
- Quantum-Si Incorporated
- Tom Thurston
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED PHOTODETECTOR WITH CHARGE STORAGE BIN OF VARIED DETECTIO...
- Publication number 20250130103
- Publication date Apr 24, 2025
- Quantum-Si Incorporated
- Thomas Raymond Thurston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA ACQUISITION CONTROL FOR ADVANCED ANALYTIC INSTRUMENTS HAVING P...
- Publication number 20240068943
- Publication date Feb 29, 2024
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED PHOTODETECTOR WITH CHARGE STORAGE BIN OF VARIED DETECTIO...
- Publication number 20230137697
- Publication date May 4, 2023
- Quantum-Si Incorporated
- Thomas Raymond Thurston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED PHOTODETECTOR WITH CHARGE STORAGE BIN OF VARIED DETECTIO...
- Publication number 20190391010
- Publication date Dec 26, 2019
- Quantum-Si Incorporated
- Tom Thurston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA ACQUISITION CONTROL FOR ADVANCED ANALYTIC INSTRUMENTS HAVING P...
- Publication number 20190383737
- Publication date Dec 19, 2019
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- G01 - MEASURING TESTING