Joseph Daniel Tobiason

Person

Woodinville, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Encoder
- Patent number 11,774,270
- Issue date Oct 3, 2023
- Mitutoyo Corporation
- Norman Laman
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system configured to measure apertures of workpieces
- Patent number 11,714,051
- Issue date Aug 1, 2023
- Mitutoyo Corporation
- Paul Gerard Gladnick
- G01 - MEASURING TESTING
Information Patent Grant
Rotating chromatic range sensor system with calibration objects and...
- Patent number 11,326,865
- Issue date May 10, 2022
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Rotating chromatic range sensor system with calibration object and...
- Patent number 11,187,521
- Issue date Nov 30, 2021
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Triangulation sensing system and method with triangulation light ex...
- Patent number 11,119,214
- Issue date Sep 14, 2021
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Tunable acoustic gradient lens system with reflective configuration...
- Patent number 11,112,541
- Issue date Sep 7, 2021
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G02 - OPTICS
Information Patent Grant
Triangulation sensing system and method with triangulation light ex...
- Patent number 10,809,378
- Issue date Oct 20, 2020
- Mitutoyo Corporation
- Paul Gerard Gladnick
- G01 - MEASURING TESTING
Information Patent Grant
Contamination and defect resistant rotary optical encoder configura...
- Patent number 10,648,838
- Issue date May 12, 2020
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Surface profiling and imaging system including optical channels pro...
- Patent number 10,593,718
- Issue date Mar 17, 2020
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring Z height values of a workpiece surface with a...
- Patent number 10,520,301
- Issue date Dec 31, 2019
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Compact coordinate measurement machine configuration with large wor...
- Patent number 10,352,679
- Issue date Jul 16, 2019
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Contamination and defect resistant optical encoder configuration in...
- Patent number 10,302,466
- Issue date May 28, 2019
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Contamination and defect resistant optical encoder configuration ou...
- Patent number 10,295,378
- Issue date May 21, 2019
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Contamination and defect resistant optical encoder configuration in...
- Patent number 10,295,648
- Issue date May 21, 2019
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Displacement encoder
- Patent number 10,274,344
- Issue date Apr 30, 2019
- Mitutoyo Corporation
- Akihide Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Contamination and defect resistant optical encoder configuration fo...
- Patent number 10,168,189
- Issue date Jan 1, 2019
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Displacement encoder
- Patent number 10,094,685
- Issue date Oct 9, 2018
- Mitutoyo Corporation
- Akihide Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Optical displacement encoder having plural scale grating portions w...
- Patent number 9,080,899
- Issue date Jul 14, 2015
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Illumination portion for an adaptable resolution optical encoder
- Patent number 9,029,757
- Issue date May 12, 2015
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Adaptable resolution optical encoder having structured illumination...
- Patent number 9,018,578
- Issue date Apr 28, 2015
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Illumination portion for an adaptable resolution optical encoder
- Patent number 8,941,052
- Issue date Jan 27, 2015
- Mitutoyo Corporation
- Yong Xie
- F21 - LIGHTING
Information Patent Grant
System and method for setting measurement force thresholds in a for...
- Patent number 8,898,923
- Issue date Dec 2, 2014
- Mitutoyo Corporation
- Michael Nahum
- G01 - MEASURING TESTING
Information Patent Grant
Multiple wavelength configuration for an optical encoder readhead i...
- Patent number 8,772,706
- Issue date Jul 8, 2014
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Image correlation displacement sensor
- Patent number 8,692,880
- Issue date Apr 8, 2014
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Image correlation displacement sensor
- Patent number 8,605,291
- Issue date Dec 10, 2013
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder including displacement sensing normal to the encode...
- Patent number 8,604,413
- Issue date Dec 10, 2013
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Lens aberration correction in a doubly telecentric displacement sensor
- Patent number 8,492,703
- Issue date Jul 23, 2013
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Fixed wavelength absolute distance interferometer
- Patent number 8,179,534
- Issue date May 15, 2012
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Controllable micro light assembly
- Patent number 8,085,295
- Issue date Dec 27, 2011
- Mitutoyo Corporation
- Joseph D. Tobiason
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems and methods for controlling strobe illumination
- Patent number 8,045,002
- Issue date Oct 25, 2011
- Mitutoyo Corporation
- Paul G. Gladnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY SYSTEM WITH POSITION AND ORIENTATION TRACKING UTILIZING L...
- Publication number 20230204340
- Publication date Jun 29, 2023
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM CONFIGURED TO MEASURE APERTURES OF WORKPIECES
- Publication number 20230168209
- Publication date Jun 1, 2023
- MITUTOYO CORPORATION
- Paul Gerard Gladnick
- G01 - MEASURING TESTING
Information Patent Application
ENCODER
- Publication number 20230059800
- Publication date Feb 23, 2023
- Mitutoyo Corporation
- Norman Laman
- G01 - MEASURING TESTING
Information Patent Application
ROTATING CHROMATIC RANGE SENSOR SYSTEM WITH CALIBRATION OBJECTS AND...
- Publication number 20210333083
- Publication date Oct 28, 2021
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
ROTATING CHROMATIC RANGE SENSOR SYSTEM WITH CALIBRATION OBJECT AND...
- Publication number 20210333093
- Publication date Oct 28, 2021
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
TUNABLE ACOUSTIC GRADIENT LENS SYSTEM WITH REFLECTIVE CONFIGURATION...
- Publication number 20210191000
- Publication date Jun 24, 2021
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G02 - OPTICS
Information Patent Application
TRIANGULATION SENSING SYSTEM AND METHOD WITH TRIANGULATION LIGHT EX...
- Publication number 20210072387
- Publication date Mar 11, 2021
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINATION AND DEFECT RESISTANT ROTARY OPTICAL ENCODER CONFIGURA...
- Publication number 20190265077
- Publication date Aug 29, 2019
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINATION AND DEFECT RESISTANT ROTARY OPTICAL ENCODER CONFIGURA...
- Publication number 20190033100
- Publication date Jan 31, 2019
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
- Publication number 20190003858
- Publication date Jan 3, 2019
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
- Publication number 20190003859
- Publication date Jan 3, 2019
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
- Publication number 20190004142
- Publication date Jan 3, 2019
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
- Publication number 20190003860
- Publication date Jan 3, 2019
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT ENCODER
- Publication number 20180299300
- Publication date Oct 18, 2018
- MITUTOYO CORPORATION
- Akihide KIMURA
- G01 - MEASURING TESTING
Information Patent Application
COMPACT COORDINATE MEASUREMENT MACHINE CONFIGURATION WITH LARGE WOR...
- Publication number 20180283840
- Publication date Oct 4, 2018
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PROFILING AND IMAGING SYSTEM INCLUDING OPTICAL CHANNELS PRO...
- Publication number 20180286027
- Publication date Oct 4, 2018
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLACEMENT ENCODER
- Publication number 20180180453
- Publication date Jun 28, 2018
- MITUTOYO CORPORATION
- Akihide KIMURA
- G01 - MEASURING TESTING
Information Patent Application
Adaptable Resolution Optical Encoder
- Publication number 20140263987
- Publication date Sep 18, 2014
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SETTING MEASUREMENT FORCE THRESHOLDS IN A FOR...
- Publication number 20140150570
- Publication date Jun 5, 2014
- Mitutoyo Corporation
- Michael Nahum
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE WAVELENGTH CONFIGURATION FOR AN OPTICAL ENCODER READHEAD
- Publication number 20130277540
- Publication date Oct 24, 2013
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION PORTION FOR AN ADAPTABLE RESOLUTION OPTICAL ENCODER
- Publication number 20130181121
- Publication date Jul 18, 2013
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION PORTION FOR AN ADAPTABLE RESOLUTION OPTICAL ENCODER
- Publication number 20130161500
- Publication date Jun 27, 2013
- Mitutoyo Corporation
- Yong Xie
- G01 - MEASURING TESTING
Information Patent Application
ADAPTABLE RESOLUTION OPTICAL ENCODER
- Publication number 20130161499
- Publication date Jun 27, 2013
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ENCODER INCLUDING PASSIVE READHEAD WITH REMOTE CONTACTLESS...
- Publication number 20130001412
- Publication date Jan 3, 2013
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ENCODER INCLUDING DISPLACEMENT SENSING NORMAL TO THE ENCODE...
- Publication number 20120312972
- Publication date Dec 13, 2012
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
IMAGE CORRELATION DISPLACEMENT SENSOR
- Publication number 20120140245
- Publication date Jun 7, 2012
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
IMAGE CORRELATION DISPLACEMENT SENSOR
- Publication number 20120081543
- Publication date Apr 5, 2012
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIXED WAVELENGTH ABSOLUTE DISTANCE INTERFEROMETER
- Publication number 20120038930
- Publication date Feb 16, 2012
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
LENS ABERRATION CORRECTION IN A DOUBLY TELECENTRIC DISPLACEMENT SENSOR
- Publication number 20110031383
- Publication date Feb 10, 2011
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...
- Publication number 20100097617
- Publication date Apr 22, 2010
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING

Joseph Daniel Tobiason

Person

Patents Grantslast 30 patents

Encoder

Metrology system configured to measure apertures of workpieces

Rotating chromatic range sensor system with calibration objects and...

Rotating chromatic range sensor system with calibration object and...

Triangulation sensing system and method with triangulation light ex...

Tunable acoustic gradient lens system with reflective configuration...

Triangulation sensing system and method with triangulation light ex...

Contamination and defect resistant rotary optical encoder configura...

Surface profiling and imaging system including optical channels pro...

Method for measuring Z height values of a workpiece surface with a...

Compact coordinate measurement machine configuration with large wor...

Contamination and defect resistant optical encoder configuration in...

Contamination and defect resistant optical encoder configuration ou...

Contamination and defect resistant optical encoder configuration in...

Displacement encoder

Contamination and defect resistant optical encoder configuration fo...

Displacement encoder

Optical displacement encoder having plural scale grating portions w...

Illumination portion for an adaptable resolution optical encoder

Adaptable resolution optical encoder having structured illumination...

Illumination portion for an adaptable resolution optical encoder

System and method for setting measurement force thresholds in a for...

Multiple wavelength configuration for an optical encoder readhead i...

Image correlation displacement sensor

Image correlation displacement sensor

Optical encoder including displacement sensing normal to the encode...

Lens aberration correction in a doubly telecentric displacement sensor

Fixed wavelength absolute distance interferometer

Controllable micro light assembly

Systems and methods for controlling strobe illumination

Patents Applicationslast 30 patents

METROLOGY SYSTEM WITH POSITION AND ORIENTATION TRACKING UTILIZING L...

METROLOGY SYSTEM CONFIGURED TO MEASURE APERTURES OF WORKPIECES

ENCODER

ROTATING CHROMATIC RANGE SENSOR SYSTEM WITH CALIBRATION OBJECTS AND...

ROTATING CHROMATIC RANGE SENSOR SYSTEM WITH CALIBRATION OBJECT AND...

TUNABLE ACOUSTIC GRADIENT LENS SYSTEM WITH REFLECTIVE CONFIGURATION...

TRIANGULATION SENSING SYSTEM AND METHOD WITH TRIANGULATION LIGHT EX...

CONTAMINATION AND DEFECT RESISTANT ROTARY OPTICAL ENCODER CONFIGURA...

CONTAMINATION AND DEFECT RESISTANT ROTARY OPTICAL ENCODER CONFIGURA...

CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...

CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...

CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...

CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...

DISPLACEMENT ENCODER

COMPACT COORDINATE MEASUREMENT MACHINE CONFIGURATION WITH LARGE WOR...

SURFACE PROFILING AND IMAGING SYSTEM INCLUDING OPTICAL CHANNELS PRO...

DISPLACEMENT ENCODER

Adaptable Resolution Optical Encoder

SYSTEM AND METHOD FOR SETTING MEASUREMENT FORCE THRESHOLDS IN A FOR...

MULTIPLE WAVELENGTH CONFIGURATION FOR AN OPTICAL ENCODER READHEAD

ILLUMINATION PORTION FOR AN ADAPTABLE RESOLUTION OPTICAL ENCODER

ILLUMINATION PORTION FOR AN ADAPTABLE RESOLUTION OPTICAL ENCODER

ADAPTABLE RESOLUTION OPTICAL ENCODER

OPTICAL ENCODER INCLUDING PASSIVE READHEAD WITH REMOTE CONTACTLESS...

OPTICAL ENCODER INCLUDING DISPLACEMENT SENSING NORMAL TO THE ENCODE...

IMAGE CORRELATION DISPLACEMENT SENSOR

IMAGE CORRELATION DISPLACEMENT SENSOR

FIXED WAVELENGTH ABSOLUTE DISTANCE INTERFEROMETER

LENS ABERRATION CORRECTION IN A DOUBLY TELECENTRIC DISPLACEMENT SENSOR

REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...