Joseph Danko

Person

Shrewsbury, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for detecting retinal abnormalities
- Patent number 8,737,703
- Issue date May 27, 2014
- The Charles Stark Draper Laboratory, Inc.
- Rami Mangoubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Particle detection method and apparatus
- Patent number 6,879,391
- Issue date Apr 12, 2005
- KLA Tencor Technologies
- Joseph J. Danko
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a patterned semiconductor wafer
- Patent number 6,774,991
- Issue date Aug 10, 2004
- Inspex Incorporated
- Joseph J. Danko
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a patterned semiconductor wafer
- Patent number 6,621,570
- Issue date Sep 16, 2003
- Inspex Incorporated
- Joseph J. Danko
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a semiconductor wafer using a d...
- Patent number 6,097,428
- Issue date Aug 1, 2000
- Inspex, Inc.
- Wo-Tak Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Particle detection method and apparatus
- Patent number 5,805,278
- Issue date Sep 8, 1998
- Inspex, Inc.
- Joseph J. Danko
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for detecting particles on a surface of a semi...
- Patent number 5,659,390
- Issue date Aug 19, 1997
- Inspex, Inc.
- Joseph J. Danko
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated optic gyro with one Bragg transducer
- Patent number 5,325,174
- Issue date Jun 28, 1994
- Northrop Corporation
- Joseph J. Danko
- G01 - MEASURING TESTING
Information Patent Grant
Compound resonator for improving optic gyro scale factor
- Patent number 5,022,760
- Issue date Jun 11, 1991
- Northrop Corporation
- Anthony W. Lawrence
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DETECTING RETINAL ABNORMALITIES
- Publication number 20110170751
- Publication date Jul 14, 2011
- Rami Mangoubi
- G06 - COMPUTING CALCULATING COUNTING

Joseph Danko

Person

Patents Grantslast 30 patents

Systems and methods for detecting retinal abnormalities

Particle detection method and apparatus

Method and apparatus for inspecting a patterned semiconductor wafer

Method and apparatus for inspecting a patterned semiconductor wafer

Method and apparatus for inspecting a semiconductor wafer using a d...

Particle detection method and apparatus

Method and apparatus for detecting particles on a surface of a semi...

Integrated optic gyro with one Bragg transducer

Compound resonator for improving optic gyro scale factor

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR DETECTING RETINAL ABNORMALITIES