Joseph Eckelman

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
AC ABIST diagnostic method, apparatus and program product
- Patent number 7,930,601
- Issue date Apr 19, 2011
- International Business Machines Corporation
- Joseph Eckelman
- G11 - INFORMATION STORAGE
Information Patent Grant
Automated system and processing for expedient diagnosis of broken s...
- Patent number 7,908,532
- Issue date Mar 15, 2011
- International Business Machines Corporation
- Joseph Eckelman
- G01 - MEASURING TESTING
Information Patent Grant
Analog testing of ring oscillators using built-in self test apparatus
- Patent number 7,765,445
- Issue date Jul 27, 2010
- International Business Machines Corporation
- Joseph E. Eckelman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for ABIST diagnostics
- Patent number 7,076,706
- Issue date Jul 11, 2006
- International Business Machines Corporation
- Joseph E. Eckelman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self-test for leakage current of driver/receiver stages
- Patent number 6,774,656
- Issue date Aug 10, 2004
- International Business Machines Corporation
- Ulrich Baur
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining repeatable yield detractors of in...
- Patent number 6,751,765
- Issue date Jun 15, 2004
- International Business Machines Corporation
- Richard F. Rizzolo
- G01 - MEASURING TESTING
Information Patent Grant
Self-test with split, asymmetric controlled driver output stage
- Patent number 6,725,171
- Issue date Apr 20, 2004
- International Business Machines Corporation
- Ulrich Baur
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AC ABIST Diagnostic Method, Apparatus and Program Product
- Publication number 20090217112
- Publication date Aug 27, 2009
- International Business Machines Corporation
- Joseph Eckelman
- G11 - INFORMATION STORAGE
Information Patent Application
Analog Testing of Ring Oscillators Using Built-In Self Test Apparatus
- Publication number 20090210760
- Publication date Aug 20, 2009
- International Business Machines Corporation
- Joseph E. Eckelman
- G01 - MEASURING TESTING
Information Patent Application
Automated System and Processing for Expedient Diagnosis of Broken S...
- Publication number 20090210763
- Publication date Aug 20, 2009
- International Business Machines Corporation
- Joseph Eckelman
- G01 - MEASURING TESTING
Information Patent Application
Method for at speed testing of multi-clock domain chips
- Publication number 20060195288
- Publication date Aug 31, 2006
- International Business Machines Corporation
- Timothy G. McNamara
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for ABIST diagnostics
- Publication number 20020157051
- Publication date Oct 24, 2002
- International Business Machines Corporation
- Joseph E. Eckelman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Self-test for leakage current of driver/receiver stages
- Publication number 20020079915
- Publication date Jun 27, 2002
- International Business Machines Corporation
- Ulrich Baur
- G01 - MEASURING TESTING
Information Patent Application
Self-test with split, asymmetric controlled driver output stage
- Publication number 20020078400
- Publication date Jun 20, 2002
- International Business Machines Corporation
- Ulrich Baur
- G01 - MEASURING TESTING

Joseph Eckelman

Person

Patents Grantslast 30 patents

AC ABIST diagnostic method, apparatus and program product

Automated system and processing for expedient diagnosis of broken s...

Analog testing of ring oscillators using built-in self test apparatus

Method and apparatus for ABIST diagnostics

Self-test for leakage current of driver/receiver stages

Method and system for determining repeatable yield detractors of in...

Self-test with split, asymmetric controlled driver output stage

Patents Applicationslast 30 patents

AC ABIST Diagnostic Method, Apparatus and Program Product

Analog Testing of Ring Oscillators Using Built-In Self Test Apparatus

Automated System and Processing for Expedient Diagnosis of Broken S...

Method for at speed testing of multi-clock domain chips

Method and apparatus for ABIST diagnostics

Self-test for leakage current of driver/receiver stages

Self-test with split, asymmetric controlled driver output stage