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Joseph Foerstel
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Santa Clara, CA, US
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last 30 patents
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Patent Grant
Apparatus for a low-cost semiconductor test interface system
Patent number
8,786,301
Issue date
Jul 22, 2014
Altera Corporation
Adam J. Wright
G01 - MEASURING TESTING
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Patent Grant
Apparatus for a low-cost semiconductor test interface system
Patent number
7,768,280
Issue date
Aug 3, 2010
Altera Corporation
Adam J. Wright
G01 - MEASURING TESTING
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Patent Grant
Touchdown counter for integrated circuit testers
Patent number
7,330,025
Issue date
Feb 12, 2008
Altera Corporation
Ronald M. Beach
G01 - MEASURING TESTING
Information
Patent Grant
Test head apparatus for use in electronic device test equipment
Patent number
5,949,239
Issue date
Sep 7, 1999
Altera Corporation
Saiid Rezvani
G01 - MEASURING TESTING