TREA

Joseph H. Bunton

Follow

Person

  • Madison, WI, US
People

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    ENERGY BEAM INPUT TO ATOM PROBE SPECIMENS FROM MULTIPLE ANGLES
    • Publication number 20210333306
    • Publication date Oct 28, 2021
    • CAMECA INSTRUMENTS INC.
    • Joseph Hale Bunton
    • G01 - MEASURING TESTING
  • Information Patent Application

    WIDE FIELD-OF-VIEW ATOM PROBE
    • Publication number 20180130636
    • Publication date May 10, 2018
    • Cameca Instruments, Inc.
    • Joseph Hale BUNTON
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ATOM PROBE PULSE ENERGY
    • Publication number 20110260054
    • Publication date Oct 27, 2011
    • Imago Scientific Instruments Corporation
    • Joseph H. Bunton
    • B82 - NANO-TECHNOLOGY
  • Information Patent Application

    LASER ATOM PROBES
    • Publication number 20100294928
    • Publication date Nov 25, 2010
    • Imago AScientific Instruments Corporation
    • Joseph Hale Bunton
    • B82 - NANO-TECHNOLOGY
  • Information Patent Application

    METHODS AND APPARATUSES TO ALIGN ENERGY BEAM TO ATOM PROBE SPECIMEN
    • Publication number 20100282964
    • Publication date Nov 11, 2010
    • Joseph Hale Bunton
    • B82 - NANO-TECHNOLOGY
  • Information Patent Application

    LASER ATOM PROBE METHODS
    • Publication number 20100116985
    • Publication date May 13, 2010
    • Imago Scientific Instruments Corporation
    • Joseph H. Bunton
    • G01 - MEASURING TESTING
  • Information Patent Application

    ATOM PROBE ELECTRODE TREATMENTS
    • Publication number 20090114620
    • Publication date May 7, 2009
    • Imago Scientific Instruments Corporation
    • Robert M. Ulfig
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHODS AND DEVICES FOR ATOM PROBE MASS RESOLUTION ENHANCEMENT
    • Publication number 20090050797
    • Publication date Feb 26, 2009
    • Imago Scientific Instruments Corporation
    • Tye Gribb
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Atom Probes, Atom Probe Specimens, and Associated Methods
    • Publication number 20080308728
    • Publication date Dec 18, 2008
    • Imago Scientific Instruments Corporation
    • Thomas F. Kelly
    • G01 - MEASURING TESTING
  • Information Patent Application

    Laser Atom Probe
    • Publication number 20070205358
    • Publication date Sep 6, 2007
    • Joseph H. Bunton
    • B82 - NANO-TECHNOLOGY
  • Information Patent Application

    Laser atom probe methods
    • Publication number 20070181826
    • Publication date Aug 9, 2007
    • Imago Scientific Instruments Corporation
    • Joseph H. Bunton
    • G01 - MEASURING TESTING