Joseph H. LYONS

Person

Wilton, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for determining a condition associated with a...
- Patent number 11,906,907
- Issue date Feb 20, 2024
- ASML Netherlands B.V.
- Derk Servatius Gertruda Brouns
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and illumination uniformity correction system
- Patent number 11,656,555
- Issue date May 23, 2023
- ASML Holding N.V.
- Janardan Nath
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask assembly
- Patent number 11,009,803
- Issue date May 18, 2021
- ASML Netherlands B.V.
- Matthias Kruizinga
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask assembly
- Patent number 10,558,129
- Issue date Feb 11, 2020
- ASML Netherlands B.V.
- Matthias Kruizinga
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus including a gas gauge and method of operating the same
- Patent number 10,429,748
- Issue date Oct 1, 2019
- ASML Holding N.V.
- Joseph Harry Lyons
- G01 - MEASURING TESTING
Information Patent Grant
Low and high pressure proximity sensors
- Patent number 9,358,696
- Issue date Jun 7, 2016
- ASML Holding N.V.
- Joseph H. Lyons
- B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information Patent Grant
Multi nozzle proximity sensor employing common sensing and nozzle s...
- Patent number 8,390,782
- Issue date Mar 5, 2013
- ASML Holding N.V.
- Joseph H. Lyons
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reverse flow gas gauge proximity sensor
- Patent number 8,144,306
- Issue date Mar 27, 2012
- ASML Holding N.V.
- Joseph H. Lyons
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Fluid gauge proximity sensor and method of operating same using a m...
- Patent number RE42650
- Issue date Aug 30, 2011
- ASML Holding N.V.
- Daniel N. Galburt
- 073 - Measuring and testing
Information Patent Grant
Parallel process focus compensation
- Patent number 7,940,374
- Issue date May 10, 2011
- ASML Holding N.V.
- Joseph H. Lyons
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pressure sensor
- Patent number 7,549,321
- Issue date Jun 23, 2009
- ASML Holding N.V.
- Peter C. Kochersperger
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor
- Patent number 7,472,580
- Issue date Jan 6, 2009
- ASML Holding N.V.
- Joseph H. Lyons
- G01 - MEASURING TESTING
Information Patent Grant
Fluid gauge proximity sensor and method of operating same using a m...
- Patent number 7,134,321
- Issue date Nov 14, 2006
- ASML Holding N.V.
- Daniel N. Galburt
- G01 - MEASURING TESTING
Information Patent Grant
System for automated focus measuring of a lithography tool
- Patent number 7,081,948
- Issue date Jul 25, 2006
- ASML Holding N.V.
- Joseph H. Lyons
- G01 - MEASURING TESTING
Information Patent Grant
Virtual gauging method for use in lithographic processing
- Patent number 7,049,618
- Issue date May 23, 2006
- ASML Holding N.V.
- Joseph H. Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas gauge proximity sensor with a modulated gas flow
- Patent number 7,021,121
- Issue date Apr 4, 2006
- ASML Holding N.V.
- Earl W. Ebert
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring the topography of a wafer surface...
- Patent number 6,984,836
- Issue date Jan 10, 2006
- ASML Holding N.V.
- Joseph H. Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for monitoring the topography of a wafer surface during lith...
- Patent number 6,979,833
- Issue date Dec 27, 2005
- ASML Holding N.V.
- Joseph H. Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for automated focus measuring of a lithography tool
- Patent number 6,885,429
- Issue date Apr 26, 2005
- ASML Holding N.V.
- Joseph H. Lyons
- G01 - MEASURING TESTING
Information Patent Grant
Virtual gauging system for use in lithographic processing
- Patent number 6,633,050
- Issue date Oct 14, 2003
- ASML Holding N.V.
- Joseph H. Lyons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Line width insensitive wafer target detection in two directions
- Patent number 5,966,215
- Issue date Oct 12, 1999
- SVG Lithography Systems, Inc.
- Louis Markoya
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Line width insensitive wafer target detection
- Patent number 5,920,396
- Issue date Jul 6, 1999
- SVG Lithography Systems, Inc.
- Louis Markoya
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...
- Publication number 20240103386
- Publication date Mar 28, 2024
- ASML NETHERLANDS B.V.
- Derk Servatius Gertruda BROUNS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
END-OF-LIFE MONITORING OF DYNAMIC GAS LOCK MEMBRANES AND PUPIL FACE...
- Publication number 20230083834
- Publication date Mar 16, 2023
- ASML Holding N.V.
- Joseph Harry LYONS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHIC APPARATUS AND ILLUMINATION UNIFORMITY CORRECTION SYSTEM
- Publication number 20220214622
- Publication date Jul 7, 2022
- ASML Holding N.V.
- Janardan NATH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ELECTROSTATIC CLAMP FOR A LITHOGRAPHIC APPARATUS
- Publication number 20220146948
- Publication date May 12, 2022
- ASML Holding N.V.
- Hari KRISHNAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...
- Publication number 20200341366
- Publication date Oct 29, 2020
- ASML NETHERLANDS B.V.
- Derk Servatius Gertruda BROUNS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask Assembly
- Publication number 20200057394
- Publication date Feb 20, 2020
- ASML NETHERLANDS B.V.
- Matthias KRUIZINGA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask Assembly
- Publication number 20180329314
- Publication date Nov 15, 2018
- Matthias KRUIZINGA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
AN APPARATUS INCLUDING A GAS GAUGE AND METHOD OF OPERATING THE SAME
- Publication number 20180157181
- Publication date Jun 7, 2018
- ASML Holding N.V.
- Joseph Harry LYONS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LOW AND HIGH PRESSURE PROXIMITY SENSORS
- Publication number 20120120380
- Publication date May 17, 2012
- ASML Holding N.V.
- Joseph H. Lyons
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
Reverse Flow Gas Gauge Proximity Sensor
- Publication number 20100110399
- Publication date May 6, 2010
- ASML Holding N.V.
- Joseph H. LYONS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Fluid Assisted Gas Gauge Proximity Sensor
- Publication number 20100103399
- Publication date Apr 29, 2010
- ASML Holding N.V.
- Joseph H. LYONS
- G01 - MEASURING TESTING
Information Patent Application
Multi Nozzle Proximity Sensor Employing Common Sensing and Nozzle S...
- Publication number 20100033705
- Publication date Feb 11, 2010
- Joseph H. LYONS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Parallel Process Focus Compensation
- Publication number 20090325087
- Publication date Dec 31, 2009
- ASML Holding N.V.
- Joseph H. LYONS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
High-Resolution Gas Gauge Proximity Sensor
- Publication number 20080034888
- Publication date Feb 14, 2008
- ASML Holding N.V.
- Joseph H. Lyons
- G01 - MEASURING TESTING
Information Patent Application
Pressure sensor
- Publication number 20070186621
- Publication date Aug 16, 2007
- ASML Holding N.V.
- Peter C. Kochersperger
- G01 - MEASURING TESTING
Information Patent Application
Pressure sensor
- Publication number 20070176121
- Publication date Aug 2, 2007
- ASML Holding N.V.
- Joseph H. Lyons
- G01 - MEASURING TESTING
Information Patent Application
VACUUM DRIVEN PROXIMITY SENSOR
- Publication number 20070151328
- Publication date Jul 5, 2007
- ASML Holding N.V.
- Peter Kochersperger
- G01 - MEASURING TESTING
Information Patent Application
Virtual gauging method for use in lithographic processing
- Publication number 20060038143
- Publication date Feb 23, 2006
- ASML Holding N.V.
- Joseph H. Lyons
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Fluid gauge proximity sensor and method of operating same using a m...
- Publication number 20060016247
- Publication date Jan 26, 2006
- ASML Holding N.V.
- Daniel N. Galburt
- G01 - MEASURING TESTING
Information Patent Application
Gas gauge proximity sensor with a modulated gas flow
- Publication number 20050274173
- Publication date Dec 15, 2005
- ASML Holding N.V.
- Earl W. Ebert
- G01 - MEASURING TESTING
Information Patent Application
System for automated focus measuring of a lithography tool
- Publication number 20050179883
- Publication date Aug 18, 2005
- ASML Holding N.V.
- Joseph H. Lyons
- G01 - MEASURING TESTING
Information Patent Application
High-resolution gas gauge proximity sensor
- Publication number 20050044963
- Publication date Mar 3, 2005
- ASML Holding N.V.
- Joseph H. Lyons
- G01 - MEASURING TESTING
Information Patent Application
System and method for monitoring the topography of a wafer surface...
- Publication number 20050001180
- Publication date Jan 6, 2005
- Joseph H. Lyons
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for automated focus measuring of a lithography tool
- Publication number 20040001192
- Publication date Jan 1, 2004
- Joseph H. Lyons
- G01 - MEASURING TESTING
Information Patent Application
System and method for monitoring the topography of a wafer surface...
- Publication number 20030201405
- Publication date Oct 30, 2003
- Joseph H. Lyons
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Joseph H. LYONS

Person

Patents Grantslast 30 patents

Apparatus and method for determining a condition associated with a...

Lithographic apparatus and illumination uniformity correction system

Mask assembly

Mask assembly

Apparatus including a gas gauge and method of operating the same

Low and high pressure proximity sensors

Multi nozzle proximity sensor employing common sensing and nozzle s...

Reverse flow gas gauge proximity sensor

Fluid gauge proximity sensor and method of operating same using a m...

Parallel process focus compensation

Pressure sensor

Pressure sensor

Fluid gauge proximity sensor and method of operating same using a m...

System for automated focus measuring of a lithography tool

Virtual gauging method for use in lithographic processing

Gas gauge proximity sensor with a modulated gas flow

System and method for monitoring the topography of a wafer surface...

System for monitoring the topography of a wafer surface during lith...

System and method for automated focus measuring of a lithography tool

Virtual gauging system for use in lithographic processing

Line width insensitive wafer target detection in two directions

Line width insensitive wafer target detection

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...

END-OF-LIFE MONITORING OF DYNAMIC GAS LOCK MEMBRANES AND PUPIL FACE...

LITHOGRAPHIC APPARATUS AND ILLUMINATION UNIFORMITY CORRECTION SYSTEM

ELECTROSTATIC CLAMP FOR A LITHOGRAPHIC APPARATUS

APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...

Mask Assembly

Mask Assembly

AN APPARATUS INCLUDING A GAS GAUGE AND METHOD OF OPERATING THE SAME

LOW AND HIGH PRESSURE PROXIMITY SENSORS

Reverse Flow Gas Gauge Proximity Sensor

Fluid Assisted Gas Gauge Proximity Sensor

Multi Nozzle Proximity Sensor Employing Common Sensing and Nozzle S...

Parallel Process Focus Compensation

High-Resolution Gas Gauge Proximity Sensor

Pressure sensor

Pressure sensor

VACUUM DRIVEN PROXIMITY SENSOR

Virtual gauging method for use in lithographic processing

Fluid gauge proximity sensor and method of operating same using a m...

Gas gauge proximity sensor with a modulated gas flow

System for automated focus measuring of a lithography tool

High-resolution gas gauge proximity sensor

System and method for monitoring the topography of a wafer surface...

System and method for automated focus measuring of a lithography tool

System and method for monitoring the topography of a wafer surface...