Joseph J. Van Horn

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Underhill, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Temporary device attach structure for test and burn in of microjoin...
- Patent number 6,747,472
- Issue date Jun 8, 2004
- International Business Machines Corporation
- John Harold Magerlein
- G01 - MEASURING TESTING
Information Patent Grant
Segmented architecture for wafer test and burn-in
- Patent number 6,275,051
- Issue date Aug 14, 2001
- International Business Machines Corporation
- Thomas W. Bachelder
- G01 - MEASURING TESTING
Information Patent Grant
Selective wafer-level testing and burn-in
- Patent number 6,255,208
- Issue date Jul 3, 2001
- International Business Machines Corporation
- William Emmett Bernier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for stressing, burning in and reducing leakage...
- Patent number 5,519,193
- Issue date May 21, 1996
- International Business Machines Corporation
- Peter E. Freiermuth
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Temporary device attach structure for test and burn in of microjoin...
- Publication number 20030136813
- Publication date Jul 24, 2003
- International Business Machines Corporation
- John Harold Magerlein
- G01 - MEASURING TESTING
Information Patent Application
Segmented architecture for wafer test & burn-in
- Publication number 20010050567
- Publication date Dec 13, 2001
- International Business Machines Corporation
- Thomas W. Bachelder
- G01 - MEASURING TESTING