Joseph M. Blecher

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Block-to-block reticle inspection
- Patent number 10,539,512
- Issue date Jan 21, 2020
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring changes in photomask defectivity
- Patent number 9,892,503
- Issue date Feb 13, 2018
- KLA-Tencor Corporation
- Chun Guan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Block-to-block reticle inspection
- Patent number 9,766,185
- Issue date Sep 19, 2017
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring changes in photomask defectivity
- Patent number 9,518,935
- Issue date Dec 13, 2016
- KLA-Tencor Corporation
- Chun Guan
- G01 - MEASURING TESTING
Information Patent Grant
Reticle defect inspection with systematic defect filter
- Patent number 9,224,195
- Issue date Dec 29, 2015
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING
Information Patent Grant
Reticle defect inspection with systematic defect filter
- Patent number 8,718,353
- Issue date May 6, 2014
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING
Information Patent Grant
Blade server interconnection
- Patent number 7,734,711
- Issue date Jun 8, 2010
- KLA-Tencor Corporation
- Joseph M. Blecher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High bandwidth image transfer
- Patent number 7,379,847
- Issue date May 27, 2008
- KLA-Tencor Corporation
- Joseph M. Blecher
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Block-to-Block Reticle Inspection
- Publication number 20180003647
- Publication date Jan 4, 2018
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Application
MONITORING CHANGES IN PHOTOMASK DEFECTIVITY
- Publication number 20170053395
- Publication date Feb 23, 2017
- KLA-Tencor Corporation
- Chun Guan
- G01 - MEASURING TESTING
Information Patent Application
Block-to-Block Reticle Inspection
- Publication number 20150078650
- Publication date Mar 19, 2015
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Application
MONITORING CHANGES IN PHOTOMASK DEFECTIVITY
- Publication number 20150029498
- Publication date Jan 29, 2015
- KLA-Tencor Corporation
- Chun Guan
- G01 - MEASURING TESTING
Information Patent Application
RETICLE DEFECT INSPECTION WITH SYSTEMATIC DEFECT FILTER
- Publication number 20140205179
- Publication date Jul 24, 2014
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING
Information Patent Application
RETICLE DEFECT INSPECTION WITH SYSTEMATIC DEFECT FILTER
- Publication number 20130236084
- Publication date Sep 12, 2013
- KLA-Tencor Corporation
- Bing Li
- G01 - MEASURING TESTING

Joseph M. Blecher

Person

Patents Grantslast 30 patents

Block-to-block reticle inspection

Monitoring changes in photomask defectivity

Block-to-block reticle inspection

Monitoring changes in photomask defectivity

Reticle defect inspection with systematic defect filter

Reticle defect inspection with systematic defect filter

Blade server interconnection

High bandwidth image transfer

Patents Applicationslast 30 patents

Block-to-Block Reticle Inspection

MONITORING CHANGES IN PHOTOMASK DEFECTIVITY

Block-to-Block Reticle Inspection

MONITORING CHANGES IN PHOTOMASK DEFECTIVITY

RETICLE DEFECT INSPECTION WITH SYSTEMATIC DEFECT FILTER

RETICLE DEFECT INSPECTION WITH SYSTEMATIC DEFECT FILTER