Joseph M. Gorin

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Quasi-peak detection systems and methods
- Patent number 10,359,459
- Issue date Jul 23, 2019
- Keysight Technologies, Inc.
- Joseph Michael Gorin
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive noise reduction in a signal analyzer
- Patent number 10,145,877
- Issue date Dec 4, 2018
- Keysight Technologies, Inc.
- Joseph Michael Gorin
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for removing images and spurs from measured rad...
- Patent number 10,044,387
- Issue date Aug 7, 2018
- Keysight Technologies, Inc.
- Joseph M. Gorin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Overlapped fast fourier transform based measurements using flat-in-...
- Patent number 9,542,358
- Issue date Jan 10, 2017
- Keysight Technologies, Inc.
- Joseph M. Gorin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of alignment for radio frequency measurement instrument and...
- Patent number 8,112,238
- Issue date Feb 7, 2012
- Agilent Technologies, Inc.
- Joseph M. Gorin
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzers with dynamic range indicator and methods of use
- Patent number 8,026,728
- Issue date Sep 27, 2011
- Agilent Technologies, Inc.
- Joseph M. Gorin
- G01 - MEASURING TESTING
Information Patent Grant
Gated sweep in spectrum analyzers
- Patent number 7,714,564
- Issue date May 11, 2010
- Agilent Technologies, Inc.
- Thomas M Wright
- G01 - MEASURING TESTING
Information Patent Grant
Swept-frequency measurements with improved speed using synthetic in...
- Patent number 7,449,876
- Issue date Nov 11, 2008
- Agilent Technologies, Inc.
- Daniel Lee Pleasant
- G01 - MEASURING TESTING
Information Patent Grant
Staggered interleaved Nyquist regions avoid guard band induced hole...
- Patent number 7,439,897
- Issue date Oct 21, 2008
- Agilent Technologies, Inc.
- Joseph M. Gorin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Using component-level calibration data to reduce system-level test
- Patent number 7,136,770
- Issue date Nov 14, 2006
- Agilent Technologies, Inc.
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Markers used in the calculation and display of band functions
- Patent number 7,107,165
- Issue date Sep 12, 2006
- Agilent Technologies, Inc.
- Corydon Joseph Boyan
- G01 - MEASURING TESTING
Information Patent Grant
Phase-noise measurement with compensation for phase noise contribut...
- Patent number 7,035,324
- Issue date Apr 25, 2006
- Agilent Technologies, Inc.
- Wing Jong Mar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Phase noise compensation for phase noise measurements
- Patent number 7,035,743
- Issue date Apr 25, 2006
- Agilent Technologies, Inc.
- Joseph M. Gorin
- G01 - MEASURING TESTING
Information Patent Grant
Phase noise compensation for spectral measurements
- Patent number 6,980,915
- Issue date Dec 27, 2005
- Agilent Technologies, Inc.
- Joseph M. Gorin
- G01 - MEASURING TESTING
Information Patent Grant
RF output spectrum measurement analyzer and method
- Patent number 6,512,788
- Issue date Jan 28, 2003
- Agilent Technologies, Inc.
- John J Kuhn
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Signal analyzer having independent analysis and display scales
- Patent number 6,370,484
- Issue date Apr 9, 2002
- Agilent Technologies, Inc.
- Joseph M Gorin
- G01 - MEASURING TESTING
Information Patent Grant
Mode selection methods for signal analyzers having alternative swep...
- Patent number 6,335,615
- Issue date Jan 1, 2002
- Agilent Technologies, Inc.
- Joseph M Gorin
- G01 - MEASURING TESTING
Information Patent Grant
Autoranging apparatus and method for improved dynamic ranging in an...
- Patent number 5,844,512
- Issue date Dec 1, 1998
- Hewlett-Packard Company
- Joseph M. Gorin
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
SPECTRUM ANALYZERS WITH DYNAMIC RANGE INDICATOR AND METHODS OF USE
- Publication number 20100156438
- Publication date Jun 24, 2010
- Joseph M. Gorin
- G01 - MEASURING TESTING
Information Patent Application
Gated sweep in spectrum analyzers
- Publication number 20090179630
- Publication date Jul 16, 2009
- Thomas M. Wright
- G01 - MEASURING TESTING
Information Patent Application
GENERATION OF TEST SPECIFICATIONS BASED ON MEASURED DATA POINTS
- Publication number 20090089005
- Publication date Apr 2, 2009
- Geoff Hopcraft
- G01 - MEASURING TESTING
Information Patent Application
STAGGERED INTERLEAVED NYQUIST REGIONS AVOID GUARD BAND INDUCED HOLE...
- Publication number 20080266157
- Publication date Oct 30, 2008
- AGILENT TECHNOLOGIES, INC.
- Joseph M. Gorin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Swept-frequency measurements with improved speed using synthetic in...
- Publication number 20070257660
- Publication date Nov 8, 2007
- Daniel Lee Pleasant
- G01 - MEASURING TESTING
Information Patent Application
Receiver dynamic range enhancement
- Publication number 20070254616
- Publication date Nov 1, 2007
- Joseph M. Gorin
- G01 - MEASURING TESTING
Information Patent Application
Local oscillator diversity system for reducing spectrum analyzer sy...
- Publication number 20070229056
- Publication date Oct 4, 2007
- Joseph M. Gorin
- G01 - MEASURING TESTING
Information Patent Application
Spectrum analyzer with cascadable trace math functions
- Publication number 20070233409
- Publication date Oct 4, 2007
- Corydon Joseph Boyan
- G01 - MEASURING TESTING
Information Patent Application
YIG filter tuning system
- Publication number 20070139132
- Publication date Jun 21, 2007
- Joseph M. Gorin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE NOISE COMPENSATION FOR PHASE NOISE MEASUREMENTS
- Publication number 20060085150
- Publication date Apr 20, 2006
- Joseph M. Gorin
- G01 - MEASURING TESTING
Information Patent Application
Method of system for testing a wireless device
- Publication number 20060040654
- Publication date Feb 23, 2006
- George S. Moore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Noise compensation for spectrum analyzer
- Publication number 20050261880
- Publication date Nov 24, 2005
- Joseph M. Gorin
- G01 - MEASURING TESTING
Information Patent Application
PHASE NOISE COMPENSATION FOR SPECTRAL MEASUREMENTS
- Publication number 20050216214
- Publication date Sep 29, 2005
- Joseph M. Gorin
- G01 - MEASURING TESTING
Information Patent Application
Using component-level calibration data to reduce system-level test
- Publication number 20050114112
- Publication date May 26, 2005
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Markers used in the calculation and display of band functions
- Publication number 20050104906
- Publication date May 19, 2005
- Corydon Joseph Boyan
- G01 - MEASURING TESTING
Information Patent Application
Phase-noise measurement with compensation for phase noise contribut...
- Publication number 20030031241
- Publication date Feb 13, 2003
- Wing Jong Mar
- G01 - MEASURING TESTING

Joseph M. Gorin

Person

Patents Grantslast 30 patents

Quasi-peak detection systems and methods

Adaptive noise reduction in a signal analyzer

Systems and methods for removing images and spurs from measured rad...

Overlapped fast fourier transform based measurements using flat-in-...

Method of alignment for radio frequency measurement instrument and...

Spectrum analyzers with dynamic range indicator and methods of use

Gated sweep in spectrum analyzers

Swept-frequency measurements with improved speed using synthetic in...

Staggered interleaved Nyquist regions avoid guard band induced hole...

Using component-level calibration data to reduce system-level test

Markers used in the calculation and display of band functions

Phase-noise measurement with compensation for phase noise contribut...

Phase noise compensation for phase noise measurements

Phase noise compensation for spectral measurements

RF output spectrum measurement analyzer and method

Signal analyzer having independent analysis and display scales

Mode selection methods for signal analyzers having alternative swep...

Autoranging apparatus and method for improved dynamic ranging in an...

Patents Applicationslast 30 patents

SPECTRUM ANALYZERS WITH DYNAMIC RANGE INDICATOR AND METHODS OF USE

Gated sweep in spectrum analyzers

GENERATION OF TEST SPECIFICATIONS BASED ON MEASURED DATA POINTS

STAGGERED INTERLEAVED NYQUIST REGIONS AVOID GUARD BAND INDUCED HOLE...

Swept-frequency measurements with improved speed using synthetic in...

Receiver dynamic range enhancement

Local oscillator diversity system for reducing spectrum analyzer sy...

Spectrum analyzer with cascadable trace math functions

YIG filter tuning system

PHASE NOISE COMPENSATION FOR PHASE NOISE MEASUREMENTS

Method of system for testing a wireless device

Noise compensation for spectrum analyzer

PHASE NOISE COMPENSATION FOR SPECTRAL MEASUREMENTS

Using component-level calibration data to reduce system-level test

Markers used in the calculation and display of band functions

Phase-noise measurement with compensation for phase noise contribut...