Joseph Marron

Person

Pittsford, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Photonic integrated circuit distance measuring interferometer
- Patent number 12,050,341
- Issue date Jul 30, 2024
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
System for coherent imaging in dynamic engagements
- Patent number 11,874,378
- Issue date Jan 16, 2024
- Raytheon Company
- Joseph Marron
- F41 - WEAPONS
Information Patent Grant
Photonic integrated circuit-based imaging systems
- Patent number 11,815,714
- Issue date Nov 14, 2023
- Raytheon Company
- Richard L. Kendrick
- G02 - OPTICS
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,703,317
- Issue date Jul 18, 2023
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
System and method for calibrating PIC-based optical phased array tr...
- Patent number 11,703,739
- Issue date Jul 18, 2023
- Raytheon Company
- Richard L. Kendrick
- G02 - OPTICS
Information Patent Grant
High pulse repetition frequency lidar
- Patent number 11,561,291
- Issue date Jan 24, 2023
- Raytheon Company
- Eran Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Photonic integrated circuit-based optical phased array phasing tech...
- Patent number 11,532,881
- Issue date Dec 20, 2022
- Raytheon Company
- Richard L. Kendrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photonic integrated circuit-based communication transmit/receive sy...
- Patent number 11,476,576
- Issue date Oct 18, 2022
- Raytheon Company
- Stephen P. Palese
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Swept frequency photonic integrated circuit for absolute metrology
- Patent number 11,320,255
- Issue date May 3, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,221,204
- Issue date Jan 11, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
System for coherent imaging in dynamic engagements
- Patent number 10,996,336
- Issue date May 4, 2021
- Raytheon Company
- Joseph Marron
- F41 - WEAPONS
Information Patent Grant
Coherent LADAR using intra-pixel quadrature detection
- Patent number 10,845,468
- Issue date Nov 24, 2020
- Raytheon Company
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Grant
Laser beam projection system with dynamic phase compensation
- Patent number 10,754,038
- Issue date Aug 25, 2020
- Raytheon Company
- Joseph Marron
- F41 - WEAPONS
Information Patent Grant
LADAR system supporting doublet waveform for sequential in-phase (I...
- Patent number 10,725,156
- Issue date Jul 28, 2020
- Raytheon Company
- Maurice J. Halmos
- G01 - MEASURING TESTING
Information Patent Grant
Ladar range rate estimation using pulse frequency shift
- Patent number 10,557,927
- Issue date Feb 11, 2020
- Raytheon Company
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Grant
High-performance beam director for high-power laser systems or othe...
- Patent number 10,502,951
- Issue date Dec 10, 2019
- Raytheon Company
- David N. Sitter
- G01 - MEASURING TESTING
Information Patent Grant
Laser beam projection system with dynamic phase compensation
- Patent number 10,401,499
- Issue date Sep 3, 2019
- Raytheon Company
- Joseph Marron
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coherent LADAR using intra-pixel quadrature detection
- Patent number 10,000,000
- Issue date Jun 19, 2018
- Raytheon Company
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Grant
Imaging systems and methods for generating image data
- Patent number 9,390,468
- Issue date Jul 12, 2016
- Lockheed Martin Corporation
- Melvin S. Ni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging systems and methods for generating image data
- Patent number 8,817,096
- Issue date Aug 26, 2014
- Lockheed Martin Corporation
- Melvin S. Ni
- G01 - MEASURING TESTING
Information Patent Grant
Combined active and passive imaging system with radiation source un...
- Patent number 8,309,900
- Issue date Nov 13, 2012
- Lockheed Martin Coherent Technologies, Inc.
- Joseph C. Marron
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Combined active and passive imaging system with radiation source un...
- Patent number 8,227,735
- Issue date Jul 24, 2012
- Lockheed Martin Coherent Technologies, Inc.
- Joseph C. Marron
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for multi-function coherent imaging
- Patent number 8,068,235
- Issue date Nov 29, 2011
- Lockheed Martin Corporation
- Joseph C. Marron
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Compensated coherent imaging for improved imaging and directed ener...
- Patent number 7,405,834
- Issue date Jul 29, 2008
- Lockheed Martin Corporation
- Joseph C. Marron
- F41 - WEAPONS
Information Patent Grant
Phase-resolved measurement for frequency-shifting interferometry
- Patent number 7,268,889
- Issue date Sep 11, 2007
- Corning Incorporated
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Overlapping common-path interferometers for two-sided measurement
- Patent number 7,268,887
- Issue date Sep 11, 2007
- Corning Incorporated
- Andrew W. Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Optical feedback from mode-selective tuner
- Patent number 7,259,860
- Issue date Aug 21, 2007
- Corning Incorporated
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Grant
Mode-selective frequency tuning system
- Patent number 7,209,499
- Issue date Apr 24, 2007
- Corning Incorporated
- Nestor Farmiga
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PHOTONIC INTEGRATED CIRCUIT DISTANCE MEASURING INTERFEROMETER
- Publication number 20240272353
- Publication date Aug 15, 2024
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT-BASED IMAGING SYSTEMS
- Publication number 20230288634
- Publication date Sep 14, 2023
- Raytheon Company
- Richard L. Kendrick
- G02 - OPTICS
Information Patent Application
COMBINED HIGH-ENERGY LASER (HEL) SYSTEM OR OTHER SYSTEM AND LASER D...
- Publication number 20230251379
- Publication date Aug 10, 2023
- Raytheon Company
- Joseph Marron
- F41 - WEAPONS
Information Patent Application
MODE CHAINING FOR MULTIFUNCTION LASER RADAR
- Publication number 20220373649
- Publication date Nov 24, 2022
- Raytheon Company
- Adam Hodge Greenberg
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT-BASED OPTICAL PHASED ARRAY PHASING TECH...
- Publication number 20220255219
- Publication date Aug 11, 2022
- Raytheon Company
- Richard L. Kendrick
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT-BASED COMMUNICATION TRANSMIT/RECEIVE SY...
- Publication number 20220255221
- Publication date Aug 11, 2022
- Raytheon Company
- Stephen P. Palese
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING PIC-BASED OPTICAL PHASED ARRAY TR...
- Publication number 20220229343
- Publication date Jul 21, 2022
- Raytheon Company
- Richard L. Kendrick
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220187055
- Publication date Jun 16, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220049945
- Publication date Feb 17, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT DISTANCE MEASURING INTERFEROMETER
- Publication number 20220019019
- Publication date Jan 20, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
HIGH PULSE REPETITION FREQUENCY LIDAR
- Publication number 20210341576
- Publication date Nov 4, 2021
- Raytheon Company
- Eran Marcus
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR COHERENT IMAGING IN DYNAMIC ENGAGEMENTS
- Publication number 20210255325
- Publication date Aug 19, 2021
- Raytheon Company
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Application
LASER BEAM PROJECTION SYSTEM WITH DYNAMIC PHASE COMPENSATION
- Publication number 20190265362
- Publication date Aug 29, 2019
- Raytheon Company
- Joseph Marron
- F41 - WEAPONS
Information Patent Application
LADAR SYSTEM SUPPORTING DOUBLET WAVEFORM FOR SEQUENTIAL IN-PHASE (I...
- Publication number 20190072651
- Publication date Mar 7, 2019
- Raytheon Company
- Maurice J. Halmos
- G01 - MEASURING TESTING
Information Patent Application
LADAR RANGE RATE ESTIMATION USING PULSE FREQUENCY SHIFT
- Publication number 20180299536
- Publication date Oct 18, 2018
- Raytheon Company
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Application
HIGH-PERFORMANCE BEAM DIRECTOR FOR HIGH-POWER LASER SYSTEMS OR OTHE...
- Publication number 20180267299
- Publication date Sep 20, 2018
- Raytheon Company
- David N. Sitter
- G02 - OPTICS
Information Patent Application
COHERENT LADAR USING INTRA-PIXEL QUADRATURE DETECTION
- Publication number 20180172806
- Publication date Jun 21, 2018
- Raytheon Company
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Application
LASER BEAM PROJECTION SYSTEM WITH DYNAMIC PHASE COMPENSATION
- Publication number 20170269214
- Publication date Sep 21, 2017
- Raytheon Company
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR COHERENT IMAGING IN DYNAMIC ENGAGEMENTS
- Publication number 20170192094
- Publication date Jul 6, 2017
- Raytheon Company
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Application
COHERENT LADAR USING INTRA-PIXEL QUADRATURE DETECTION
- Publication number 20160266243
- Publication date Sep 15, 2016
- Raytheon Company
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Application
Overlapping common-path interferometers for two-sided measurement
- Publication number 20060139656
- Publication date Jun 29, 2006
- Corning Incorporated
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Application
Optical feedback from mode-selective tuner
- Publication number 20060062260
- Publication date Mar 23, 2006
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Application
Mode-selective frequency tuning system
- Publication number 20060062261
- Publication date Mar 23, 2006
- Nestor Farmiga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase-resolved measurement for frequency-shifting interferometry
- Publication number 20060061772
- Publication date Mar 23, 2006
- Andrew Kulawiec
- G01 - MEASURING TESTING

Joseph Marron

Person

Patents Grantslast 30 patents

Photonic integrated circuit distance measuring interferometer

System for coherent imaging in dynamic engagements

Photonic integrated circuit-based imaging systems

Heterodyne photonic integrated circuit for absolute metrology

System and method for calibrating PIC-based optical phased array tr...

High pulse repetition frequency lidar

Photonic integrated circuit-based optical phased array phasing tech...

Photonic integrated circuit-based communication transmit/receive sy...

Swept frequency photonic integrated circuit for absolute metrology

Heterodyne photonic integrated circuit for absolute metrology

System for coherent imaging in dynamic engagements

Coherent LADAR using intra-pixel quadrature detection

Laser beam projection system with dynamic phase compensation

LADAR system supporting doublet waveform for sequential in-phase (I...

Ladar range rate estimation using pulse frequency shift

High-performance beam director for high-power laser systems or othe...

Laser beam projection system with dynamic phase compensation

Coherent LADAR using intra-pixel quadrature detection

Imaging systems and methods for generating image data

Imaging systems and methods for generating image data

Combined active and passive imaging system with radiation source un...

Combined active and passive imaging system with radiation source un...

Systems and methods for multi-function coherent imaging

Compensated coherent imaging for improved imaging and directed ener...

Phase-resolved measurement for frequency-shifting interferometry

Overlapping common-path interferometers for two-sided measurement

Optical feedback from mode-selective tuner

Mode-selective frequency tuning system

Patents Applicationslast 30 patents

PHOTONIC INTEGRATED CIRCUIT DISTANCE MEASURING INTERFEROMETER

PHOTONIC INTEGRATED CIRCUIT-BASED IMAGING SYSTEMS

COMBINED HIGH-ENERGY LASER (HEL) SYSTEM OR OTHER SYSTEM AND LASER D...

MODE CHAINING FOR MULTIFUNCTION LASER RADAR

PHOTONIC INTEGRATED CIRCUIT-BASED OPTICAL PHASED ARRAY PHASING TECH...

PHOTONIC INTEGRATED CIRCUIT-BASED COMMUNICATION TRANSMIT/RECEIVE SY...

SYSTEM AND METHOD FOR CALIBRATING PIC-BASED OPTICAL PHASED ARRAY TR...

HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

PHOTONIC INTEGRATED CIRCUIT DISTANCE MEASURING INTERFEROMETER

HIGH PULSE REPETITION FREQUENCY LIDAR

SYSTEM FOR COHERENT IMAGING IN DYNAMIC ENGAGEMENTS

LASER BEAM PROJECTION SYSTEM WITH DYNAMIC PHASE COMPENSATION

LADAR SYSTEM SUPPORTING DOUBLET WAVEFORM FOR SEQUENTIAL IN-PHASE (I...

LADAR RANGE RATE ESTIMATION USING PULSE FREQUENCY SHIFT

HIGH-PERFORMANCE BEAM DIRECTOR FOR HIGH-POWER LASER SYSTEMS OR OTHE...

COHERENT LADAR USING INTRA-PIXEL QUADRATURE DETECTION

LASER BEAM PROJECTION SYSTEM WITH DYNAMIC PHASE COMPENSATION

SYSTEM FOR COHERENT IMAGING IN DYNAMIC ENGAGEMENTS

COHERENT LADAR USING INTRA-PIXEL QUADRATURE DETECTION

Overlapping common-path interferometers for two-sided measurement

Optical feedback from mode-selective tuner

Mode-selective frequency tuning system

Phase-resolved measurement for frequency-shifting interferometry