Joseph Nicholas Kochey

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St. Petersburg, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Non-contact method for acquiring charge-voltage data on miniature t...
- Patent number 7,202,691
- Issue date Apr 10, 2007
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ENHANCED SENSITIVITY NON-CONTACT ELECTRICAL MONITORING OF COPPER CO...
- Publication number 20090047748
- Publication date Feb 19, 2009
- Alexandre Savtchouk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Non-contact method for acquiring charge-voltage data on miniature t...
- Publication number 20060267622
- Publication date Nov 30, 2006
- Jacek Lagowski
- G01 - MEASURING TESTING