Joseph P. Ramon

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer having scribe line test modules including match...
- Patent number 8,134,382
- Issue date Mar 13, 2012
- Texas Instruments Incorporated
- Tathagata Chatterjee
- G01 - MEASURING TESTING
Information Patent Grant
Testing method and apparatus assuring semiconductor device quality...
- Patent number 6,184,048
- Issue date Feb 6, 2001
- Texas Instruments Incorporated
- Joseph Ramon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR WAFER HAVING SCRIBE LINE TEST MODULES INCLUDING MATCH...
- Publication number 20110253999
- Publication date Oct 20, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Tathagata Chatterjee
- G06 - COMPUTING CALCULATING COUNTING