Joseph R. Baker

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New Milford, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe assembly for testing integrated circuit devices
- Patent number 5,355,079
- Issue date Oct 11, 1994
- Wentworth Laboratories, Inc.
- Arthur Evans
- G01 - MEASURING TESTING
Information Patent Grant
Test probe assembly for testing integrated circuit devices
- Patent number 4,975,638
- Issue date Dec 4, 1990
- Wentworth Laboratories
- Arthur Evans
- G01 - MEASURING TESTING