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Joseph S. Vaccaro
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Chandler, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Devices with arbitrated interface busses, and methods of their oper...
Patent number
9,563,590
Issue date
Feb 7, 2017
NXP USA, INC.
Joseph S. Vaccaro
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for testing multiple-IC devices
Patent number
9,110,142
Issue date
Aug 18, 2015
FREESCALE SEMICONDUCTOR, INC.
Michael E. Stanley
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for testing multiple-IC devices
Patent number
8,756,467
Issue date
Jun 17, 2014
FREESCALE SEMICONDUCTOR, INC.
Joseph S. Vaccaro
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for extending semiconductor chip testing with...
Patent number
7,322,000
Issue date
Jan 22, 2008
FREESCALE SEMICONDUCTOR, INC.
Tomas V. Colunga
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for incorporating IDDQ testing into logic BIST
Patent number
7,272,767
Issue date
Sep 18, 2007
FREESCALE SEMICONDUCTOR, INC.
Tomas V. Colunga
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEVICES WITH ARBITRATED INTERFACE BUSSES, AND METHODS OF THEIR OPER...
Publication number
20150261704
Publication date
Sep 17, 2015
JOSEPH S. VACCARO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND APPARATUS FOR TESTING MULTIPLE-IC DEVICES
Publication number
20130139015
Publication date
May 30, 2013
FREESCALE SEMICONDUCTOR, INC.
Joseph S. Vaccaro
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR TESTING MULTIPLE-IC DEVICES
Publication number
20130085704
Publication date
Apr 4, 2013
FREESCALE SEMICONDUCTOR, INC.
Michael E. Stanley
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for extending semiconductor chip testing with...
Publication number
20060248419
Publication date
Nov 2, 2006
Tomas V. Colunga
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for incorporating IDDQ testing into logic BIST
Publication number
20060248424
Publication date
Nov 2, 2006
Tomas V. Colunga
G01 - MEASURING TESTING