Joseph Scola

Person

Medfield, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for bundled location and regional inspection
- Patent number 6,920,241
- Issue date Jul 19, 2005
- Cognex Corporation
- Paul Dutta-Choudhury
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspection for under-resolved features in...
- Patent number 6,718,074
- Issue date Apr 6, 2004
- Cognex Corporation
- Paul Dutta-Choudhury
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Boundary analyzer
- Patent number 6,714,679
- Issue date Mar 30, 2004
- Cognex Corporation
- Joseph Scola
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device image inspection with contrast enhancement
- Patent number 6,587,582
- Issue date Jul 1, 2003
- Cognex Corporation
- Sanjay J. Nichani
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device image inspection with contrast enhancement
- Patent number 6,298,149
- Issue date Oct 2, 2001
- Cognex Corporation
- Sanjay J. Nichani
- G01 - MEASURING TESTING
Information Patent Grant
Machine vision system for object feature analysis and validation ba...
- Patent number 6,175,644
- Issue date Jan 16, 2001
- Cognex Corporation
- Joseph R. Scola
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device image inspection utilizing image subtraction a...
- Patent number 5,949,901
- Issue date Sep 7, 1999
- Sanjay Nichani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Model-based adaptive segmentation
- Patent number 5,949,905
- Issue date Sep 7, 1999
- Sanjay Nichani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for high speed identification of objects havin...
- Patent number 5,742,037
- Issue date Apr 21, 1998
- Cognex Corp.
- Joseph R. Scola
- G06 - COMPUTING CALCULATING COUNTING

Joseph Scola

Person

Patents Grantslast 30 patents

System and method for bundled location and regional inspection

Method and apparatus for inspection for under-resolved features in...

Boundary analyzer

Semiconductor device image inspection with contrast enhancement

Semiconductor device image inspection with contrast enhancement

Machine vision system for object feature analysis and validation ba...

Semiconductor device image inspection utilizing image subtraction a...

Model-based adaptive segmentation

Method and apparatus for high speed identification of objects havin...