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Joseph SPINAZOLA
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Medway, MA, US
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Patents Grants
last 30 patents
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Patent Grant
Polarized, energy dispersive x-ray fluorescence system and method
Patent number
12,247,934
Issue date
Mar 11, 2025
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Sample handling apparatus for pressurized fluids and X-ray analyzer...
Patent number
10,705,033
Issue date
Jul 7, 2020
X-Ray Optical Systems, Inc.
Joseph J Spinazola
G01 - MEASURING TESTING
Information
Patent Grant
Active, variable sample concentration method and apparatus for sub-...
Patent number
10,317,350
Issue date
Jun 11, 2019
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
POLARIZED, ENERGY DISPERSIVE X-RAY FLUORESCENCE SYSTEM AND METHOD
Publication number
20240035990
Publication date
Feb 1, 2024
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE HANDLING APPARATUS FOR PRESSURIZED FLUIDS AND X-RAY ANALYZER...
Publication number
20190056337
Publication date
Feb 21, 2019
X-Ray Optical Systems, Inc.
Joseph J SPINAZOLA
G01 - MEASURING TESTING
Information
Patent Application
ACTIVE, VARIABLE SAMPLE CONCENTRATION METHOD AND APPARATUS FOR SUB-...
Publication number
20170097311
Publication date
Apr 6, 2017
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
Information
Patent Application
NON-HOMOGENEOUS SAMPLE SCANNING APPARATUS, AND X-RAY ANALYZER APPLI...
Publication number
20160274042
Publication date
Sep 22, 2016
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING