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Joseph Van DeWeert
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Maywood, NJ, US
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Patents Grants
last 30 patents
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Patent Grant
Pressure switch employing silicon on insulator (SOI) technology
Patent number
7,964,807
Issue date
Jun 21, 2011
Kulite Semiconductor Products, Inc.
Anthony D. Kurtz
G01 - MEASURING TESTING
Information
Patent Grant
Leak detector for a pressurized cylinder
Patent number
7,716,964
Issue date
May 18, 2010
Kulite Semiconductor Products, Inc.
Anthony D. Kurtz
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for providing an output proportional to pressure divided...
Patent number
7,347,098
Issue date
Mar 25, 2008
Kulite Semiconductor Products, Inc.
Anthony D. Kurtz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for temperature compensation of a piezoresistive gaged metal...
Publication number
20100199775
Publication date
Aug 12, 2010
Kulite Semiconductor Products, Inc.
Anthony D. Kurtz
G01 - MEASURING TESTING
Information
Patent Application
High temperature,high bandwidth pressure acquisition system
Publication number
20100185403
Publication date
Jul 22, 2010
Kulite Semiconductor Products,Inc.
Anthony D. Kurtz
G01 - MEASURING TESTING
Information
Patent Application
Pressure switch employing silicon on insulator (SOI) technology
Publication number
20090078547
Publication date
Mar 26, 2009
Anthony D. Kurtz
G01 - MEASURING TESTING
Information
Patent Application
Leak detector for a pressurized cylinder
Publication number
20080163668
Publication date
Jul 10, 2008
Anthony D. Kurtz
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for providing an output proportional to pressure divided...
Publication number
20070295095
Publication date
Dec 27, 2007
Anthony D. Kurtz
G01 - MEASURING TESTING