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Joshua Beutler
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Albuquerque, NM, US
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last 30 patents
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Patent Grant
Defect screening method for electronic circuits and circuit compone...
Patent number
10,145,894
Issue date
Dec 4, 2018
National Technology & Engineering Solutions of Sandia, LLC
Paiboon Tangyunyong
G01 - MEASURING TESTING
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Patent Grant
Scanning method for screening of electronic devices
Patent number
10,094,874
Issue date
Oct 9, 2018
National Technology & Engineering Solutions of Sandia, LLC
Paiboon Tangyunyong
G01 - MEASURING TESTING
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Patent Grant
Visible light laser voltage probing on thinned substrates
Patent number
9,599,667
Issue date
Mar 21, 2017
Sandia Corporation
Joshua Beutler
H01 - BASIC ELECTRIC ELEMENTS