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Joshua Daniel Tomayer
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Meridian, ID, US
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last 30 patents
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Patent Grant
Method and apparatus for on-chip stress detection
Patent number
11,978,680
Issue date
May 7, 2024
Micron Technology, Inc.
Kenneth William Marr
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Memory device including circuitry under bond pads
Patent number
11,424,169
Issue date
Aug 23, 2022
Micron Technology, Inc.
Chiara Cerafogli
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Method and apparatus for on-chip stress detection
Patent number
11,189,536
Issue date
Nov 30, 2021
Micron Technology, Inc.
Kenneth William Marr
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND APPARATUS FOR ON-CHIP STRESS DETECTION
Publication number
20220084896
Publication date
Mar 17, 2022
Micron Technology, Inc.
Kenneth William Marr
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEMORY DEVICE INCLUDING CIRCUITRY UNDER BOND PADS
Publication number
20210043525
Publication date
Feb 11, 2021
Micron Technology, Inc.
Chiara Cerafogli
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD AND APPARATUS FOR ON-CHIP STRESS DETECTION
Publication number
20200211914
Publication date
Jul 2, 2020
Micron Technology, Inc.
Kenneth William Marr
H01 - BASIC ELECTRIC ELEMENTS