Joshua G. Nickel

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
High tolerance connection between elements
- Patent number 11,994,916
- Issue date May 28, 2024
- Apple Inc.
- Scott A. Myers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High tolerance connection between elements
- Patent number 11,573,608
- Issue date Feb 7, 2023
- Apple Inc.
- Scott A. Myers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High tolerance connection between elements
- Patent number 10,664,019
- Issue date May 26, 2020
- Apple Inc.
- Scott A. Myers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High tolerance connection between elements
- Patent number 10,334,745
- Issue date Jun 25, 2019
- Apple Inc.
- Scott A. Myers
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High tolerance connection between elements
- Patent number 9,829,926
- Issue date Nov 28, 2017
- Apple Inc.
- Scott A. Myers
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multiband antennas formed from bezel bands with gaps
- Patent number 9,653,783
- Issue date May 16, 2017
- Apple Inc.
- Joshua G. Nickel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology and apparatus for testing conductive adhesive within an...
- Patent number 9,404,842
- Issue date Aug 2, 2016
- Apple Inc.
- Joshua G. Nickel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Radio-frequency test system with tunable test antenna circuitry
- Patent number 9,404,965
- Issue date Aug 2, 2016
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact test system for determining whether electronic device s...
- Patent number 9,372,228
- Issue date Jun 21, 2016
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Grant
Antenna with switchable inductor low-band tuning
- Patent number 9,350,069
- Issue date May 24, 2016
- Apple Inc.
- Mattia Pascolini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for reducing path loss while testing wireless electronic de...
- Patent number 9,319,908
- Issue date Apr 19, 2016
- Apple Inc.
- Joshua G. Nickel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and apparatus for testing small form factor antenna tuning...
- Patent number 9,310,422
- Issue date Apr 12, 2016
- Apple Inc.
- Jayesh Nath
- G01 - MEASURING TESTING
Information Patent Grant
Test probe alignment structures for radio-frequency test systems
- Patent number 9,285,419
- Issue date Mar 15, 2016
- Apple Inc.
- Joshua G. Nickel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Customizable antenna feed structure
- Patent number 9,287,627
- Issue date Mar 15, 2016
- Apple Inc.
- Daniel W. Jarvis
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Testing system with capacitively coupled probe for evaluating elect...
- Patent number 9,274,142
- Issue date Mar 1, 2016
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device with calibrated tunable antenna
- Patent number 9,270,012
- Issue date Feb 23, 2016
- Apple Inc.
- Joshua G. Nickel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for field testing wireless devices with reduced multipath in...
- Patent number 9,213,053
- Issue date Dec 15, 2015
- Apple Inc.
- Joshua G. Nickel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods for characterizing tunable radio-frequency elements
- Patent number 9,214,718
- Issue date Dec 15, 2015
- Apple Inc.
- Matthew A. Mow
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods for validating radio-frequency test stations
- Patent number 9,164,159
- Issue date Oct 20, 2015
- Apple Inc.
- Jayesh Nath
- G01 - MEASURING TESTING
Information Patent Grant
Multiband antennas formed from bezel bands with gaps
- Patent number 9,160,056
- Issue date Oct 13, 2015
- Apple Inc.
- Josh Nickel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test system with temporary test structures
- Patent number 9,157,954
- Issue date Oct 13, 2015
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Grant
Bidirectional radio-frequency probing
- Patent number 9,157,930
- Issue date Oct 13, 2015
- Apple Inc.
- Joshua G. Nickel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and apparatus for testing electronic devices with antenna a...
- Patent number 9,154,972
- Issue date Oct 6, 2015
- Apple Inc.
- Jerzy Guterman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and apparatus for performing passive antenna testing with a...
- Patent number 9,084,124
- Issue date Jul 14, 2015
- Apple Inc.
- Joshua G. Nickel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test system with adjustable radio-frequency probe array
- Patent number 9,000,989
- Issue date Apr 7, 2015
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for performing coexistence testing for multi-...
- Patent number 8,995,926
- Issue date Mar 31, 2015
- Apple Inc.
- Matthew A. Mow
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods for modeling tunable radio-frequency elements
- Patent number 8,947,113
- Issue date Feb 3, 2015
- Apple Inc.
- Liang Han
- G01 - MEASURING TESTING
Information Patent Grant
High tolerance connection between elements
- Patent number 8,913,395
- Issue date Dec 16, 2014
- Apple Inc.
- Scott Myers
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Non-contact test system for determining whether electronic device s...
- Patent number 8,847,617
- Issue date Sep 30, 2014
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Grant
Tunable antenna system with multiple feeds
- Patent number 8,798,554
- Issue date Aug 5, 2014
- Apple Inc.
- Dean F. Darnell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS
- Publication number 20240272681
- Publication date Aug 15, 2024
- Apple Inc.
- Scott A. Myers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS
- Publication number 20230176625
- Publication date Jun 8, 2023
- Apple Inc.
- Scott A. Myers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS
- Publication number 20200249724
- Publication date Aug 6, 2020
- Apple Inc.
- Scott A. Myers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS
- Publication number 20190269027
- Publication date Aug 29, 2019
- Apple Inc.
- Scott A. Myers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS
- Publication number 20190132977
- Publication date May 2, 2019
- Apple Inc.
- Scott A. Myers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiband Antennas Formed From Bezel Bands with Gaps
- Publication number 20150357703
- Publication date Dec 10, 2015
- Apple Inc.
- Joshua G. Nickel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radio-Frequency Test System with Tunable Test Antenna Circuitry
- Publication number 20150177277
- Publication date Jun 25, 2015
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS
- Publication number 20150122540
- Publication date May 7, 2015
- Apple Inc.
- Scott A. Myers
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
NON-CONTACT TEST SYSTEM
- Publication number 20150048858
- Publication date Feb 19, 2015
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
Methodology and Apparatus for Testing Conductive Adhesive Within An...
- Publication number 20150050893
- Publication date Feb 19, 2015
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Testing Electronic Devices with Antenna A...
- Publication number 20140370821
- Publication date Dec 18, 2014
- Jerzy Guterman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Methods and Apparatus for Performing Passive Antenna Testing with A...
- Publication number 20140179239
- Publication date Jun 26, 2014
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
Methods for Validating Radio-Frequency Test Stations
- Publication number 20140167794
- Publication date Jun 19, 2014
- Apple Inc.
- Jayesh Nath
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Performing Coexistence Testing for Multi-...
- Publication number 20140087668
- Publication date Mar 27, 2014
- Apple Inc.
- Matthew A. Mow
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Methods and Apparatus for Testing Small Form Factor Antenna Tuning...
- Publication number 20130321012
- Publication date Dec 5, 2013
- Jayesh Nath
- G01 - MEASURING TESTING
Information Patent Application
Methods for Modeling Tunable Radio-Frequency Elements
- Publication number 20130293249
- Publication date Nov 7, 2013
- Liang Han
- G01 - MEASURING TESTING
Information Patent Application
Impedance Reference Structures for Radio-Frequency Test Systems
- Publication number 20130271328
- Publication date Oct 17, 2013
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
Methods for Characterizing Tunable Radio-Frequency Elements
- Publication number 20130234741
- Publication date Sep 12, 2013
- Matthew A. Mow
- G01 - MEASURING TESTING
Information Patent Application
Tunable Antenna System with Multiple Feeds
- Publication number 20130203364
- Publication date Aug 8, 2013
- Dean F. Darnell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE WITH CALIBRATED TUNABLE ANTENNA
- Publication number 20130194139
- Publication date Aug 1, 2013
- Joshua G. Nickel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Antenna With Switchable Inductor Low-Band Tuning
- Publication number 20130169490
- Publication date Jul 4, 2013
- Mattia Pascolini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for Reducing Path Loss While Testing Wireless Electronic De...
- Publication number 20130093447
- Publication date Apr 18, 2013
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
CUSTOMIZABLE ANTENNA FEED STRUCTURE
- Publication number 20130050046
- Publication date Feb 28, 2013
- Daniel W. Jarvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SYSTEM WITH ADJUSTABLE RADIO-FREQUENCY PROBE ARRAY
- Publication number 20130044033
- Publication date Feb 21, 2013
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM WITH CONTACT TEST PROBES
- Publication number 20130015870
- Publication date Jan 17, 2013
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
TEST PROBE ALIGNMENT STRUCTURES FOR RADIO-FREQUENCY TEST SYSTEMS
- Publication number 20130002280
- Publication date Jan 3, 2013
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR PROVIDING PROPER IMPEDANCE MATCHING DURING RADIO-FREQUE...
- Publication number 20120319697
- Publication date Dec 20, 2012
- Justin Gregg
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM WITH TEMPORARY TEST STRUCTURES
- Publication number 20120306521
- Publication date Dec 6, 2012
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM WITH ELECTRICALLY COUPLED AND WIRELESSLY COUPLED PROBES
- Publication number 20120293379
- Publication date Nov 22, 2012
- Joshua G. Nickel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
BIDIRECTIONAL RADIO-FREQUENCY PROBING
- Publication number 20120287792
- Publication date Nov 15, 2012
- Joshua G. Nickel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Joshua G. Nickel

Person

Patents Grantslast 30 patents

High tolerance connection between elements

High tolerance connection between elements

High tolerance connection between elements

High tolerance connection between elements

High tolerance connection between elements

Multiband antennas formed from bezel bands with gaps

Methodology and apparatus for testing conductive adhesive within an...

Radio-frequency test system with tunable test antenna circuitry

Non-contact test system for determining whether electronic device s...

Antenna with switchable inductor low-band tuning

Methods for reducing path loss while testing wireless electronic de...

Methods and apparatus for testing small form factor antenna tuning...

Test probe alignment structures for radio-frequency test systems

Customizable antenna feed structure

Testing system with capacitively coupled probe for evaluating elect...

Electronic device with calibrated tunable antenna

System for field testing wireless devices with reduced multipath in...

Methods for characterizing tunable radio-frequency elements

Methods for validating radio-frequency test stations

Multiband antennas formed from bezel bands with gaps

Test system with temporary test structures

Bidirectional radio-frequency probing

Methods and apparatus for testing electronic devices with antenna a...

Methods and apparatus for performing passive antenna testing with a...

Test system with adjustable radio-frequency probe array

Methods and apparatus for performing coexistence testing for multi-...

Methods for modeling tunable radio-frequency elements

High tolerance connection between elements

Non-contact test system for determining whether electronic device s...

Tunable antenna system with multiple feeds

Patents Applicationslast 30 patents

HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS

HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS

HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS

HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS

HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS

Multiband Antennas Formed From Bezel Bands with Gaps

Radio-Frequency Test System with Tunable Test Antenna Circuitry

HIGH TOLERANCE CONNECTION BETWEEN ELEMENTS

NON-CONTACT TEST SYSTEM

Methodology and Apparatus for Testing Conductive Adhesive Within An...

Methods and Apparatus for Testing Electronic Devices with Antenna A...

Methods and Apparatus for Performing Passive Antenna Testing with A...

Methods for Validating Radio-Frequency Test Stations

Methods and Apparatus for Performing Coexistence Testing for Multi-...

Methods and Apparatus for Testing Small Form Factor Antenna Tuning...

Methods for Modeling Tunable Radio-Frequency Elements

Impedance Reference Structures for Radio-Frequency Test Systems

Methods for Characterizing Tunable Radio-Frequency Elements

Tunable Antenna System with Multiple Feeds

ELECTRONIC DEVICE WITH CALIBRATED TUNABLE ANTENNA

Antenna With Switchable Inductor Low-Band Tuning

Methods for Reducing Path Loss While Testing Wireless Electronic De...

CUSTOMIZABLE ANTENNA FEED STRUCTURE

TEST SYSTEM WITH ADJUSTABLE RADIO-FREQUENCY PROBE ARRAY

TEST SYSTEM WITH CONTACT TEST PROBES

TEST PROBE ALIGNMENT STRUCTURES FOR RADIO-FREQUENCY TEST SYSTEMS

METHODS FOR PROVIDING PROPER IMPEDANCE MATCHING DURING RADIO-FREQUE...

TEST SYSTEM WITH TEMPORARY TEST STRUCTURES

TESTING SYSTEM WITH ELECTRICALLY COUPLED AND WIRELESSLY COUPLED PROBES

BIDIRECTIONAL RADIO-FREQUENCY PROBING