TREA

Joshua J. Krueger

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  • Burlington, VT, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Mask defect analysis system
    • Patent number 7,492,940
    • Issue date Feb 17, 2009
    • International Business Machines Corporation
    • James A. Bruce
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Mask defect analysis system
    • Patent number 7,492,941
    • Issue date Feb 17, 2009
    • International Business Machines Corporation
    • James A. Bruce
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Mask defect analysis system
    • Patent number 7,257,247
    • Issue date Aug 14, 2007
    • International Business Machines Corporation
    • James A. Bruce
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Mask/wafer control structure and algorithm for placement
    • Patent number 6,766,507
    • Issue date Jul 20, 2004
    • International Business Machines Corporation
    • James A. Bruce
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

  • Information Patent Application

    MASK DEFECT ANALYSIS SYSTEM
    • Publication number 20070248257
    • Publication date Oct 25, 2007
    • International Business Machines Corporation
    • James A. Bruce
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    MASK DEFECT ANALYSIS SYSTEM
    • Publication number 20070237384
    • Publication date Oct 11, 2007
    • International Business Machines Corporation
    • James A. Bruce
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Mask/wafer control structure and algorithm for placement
    • Publication number 20030196185
    • Publication date Oct 16, 2003
    • International Business Machines Corporation
    • James A. Bruce
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Mask defect analysis system
    • Publication number 20030161525
    • Publication date Aug 28, 2003
    • International Business Machines Corporation
    • James A. Bruce
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY