Joshua J. O'Brien

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated communication link testing
- Patent number 12,222,388
- Issue date Feb 11, 2025
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Grant
Multi-mode measurement probe
- Patent number 12,210,039
- Issue date Jan 28, 2025
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Grant
Protocol aware oscilloscope for busses with sideband and control si...
- Patent number 11,994,967
- Issue date May 28, 2024
- Tektronix, Inc.
- Joshua J. O'Brien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test and measurement instrument accessory with reconfigurable proce...
- Patent number 11,815,548
- Issue date Nov 14, 2023
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Grant
Integrated communication link testing
- Patent number 11,789,070
- Issue date Oct 17, 2023
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement devices, systems and methods associated with a...
- Patent number 11,650,225
- Issue date May 16, 2023
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synchronizing multiple test and measurement...
- Patent number 11,372,025
- Issue date Jun 28, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test and measurement devices, systems, and methods associated with...
- Patent number 11,187,720
- Issue date Nov 30, 2021
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Grant
Categorization of acquired data based on explicit and implicit means
- Patent number 11,181,552
- Issue date Nov 23, 2021
- Tektronix, Inc.
- Joshua J. O'Brien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated communication link testing
- Patent number 11,009,546
- Issue date May 18, 2021
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synchronizing multiple test and measurement...
- Patent number 11,002,764
- Issue date May 11, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Analog transitional storage
- Patent number 10,670,632
- Issue date Jun 2, 2020
- Tektronix, Inc.
- David A. Holaday
- G01 - MEASURING TESTING
Information Patent Grant
Slot interposer probe
- Patent number 7,868,625
- Issue date Jan 11, 2011
- Tektronix, Inc.
- Devin G. Burt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERLEAVED DIGITAL TRIGGER CORRECTION
- Publication number 20240353449
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POW...
- Publication number 20240353470
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Niranjan R. Hegde
- G01 - MEASURING TESTING
Information Patent Application
SPLIT-PATH MULTIPLEXING ACCESSORY FOR A TEST AND MEASUREMENT INSTRU...
- Publication number 20240159824
- Publication date May 16, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...
- Publication number 20240069094
- Publication date Feb 29, 2024
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED COMMUNICATION LINK TESTING
- Publication number 20240044975
- Publication date Feb 8, 2024
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL TRIGGER PATHS IN A TEST AND MEASUREMENT INSTRUMENT
- Publication number 20230055303
- Publication date Feb 23, 2023
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE SAMPLE-RATE DATA CONVERTER
- Publication number 20220407523
- Publication date Dec 22, 2022
- Tektronix, Inc.
- Joshua J. O'Brien
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MULTI-MODE MEASUREMENT PROBE
- Publication number 20220334144
- Publication date Oct 20, 2022
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT DEVICES, SYSTEMS AND METHODS ASSOCIATED WITH A...
- Publication number 20220196701
- Publication date Jun 23, 2022
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC RECOMMENDATION OF FEATURE UPGRADES IN A TEST AND MEASUREM...
- Publication number 20220148065
- Publication date May 12, 2022
- Tektronix, Inc.
- Joshua J. O'Brien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...
- Publication number 20220018896
- Publication date Jan 20, 2022
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED COMMUNICATION LINK TESTING
- Publication number 20210270893
- Publication date Sep 2, 2021
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...
- Publication number 20210263076
- Publication date Aug 26, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
PROTOCOL AWARE OSCILLOSCOPE FOR BUSSES WITH SIDEBAND AND CONTROL SI...
- Publication number 20210149781
- Publication date May 20, 2021
- Tektronix, Inc.
- Joshua J. O'Brien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...
- Publication number 20200256893
- Publication date Aug 13, 2020
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST AND MEASUREMENT DEVICES, SYSTEMS, AND METHODS ASSOCIATED WITH...
- Publication number 20200200794
- Publication date Jun 25, 2020
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Application
CATEGORIZATION OF ACQUIRED DATA BASED ON EXPLICIT AND IMPLICIT MEANS
- Publication number 20200166546
- Publication date May 28, 2020
- Tektronix, Inc.
- Joshua J. O'Brien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED COMMUNICATION LINK TESTING
- Publication number 20190383873
- Publication date Dec 19, 2019
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Application
ANALOG TRANSITIONAL STORAGE
- Publication number 20180299491
- Publication date Oct 18, 2018
- Tektronix, Inc.
- David A. Holaday
- G01 - MEASURING TESTING
Information Patent Application
SLOT INTERPOSER PROBE
- Publication number 20090284268
- Publication date Nov 19, 2009
- Tektronix, Inc.
- Devin G. Burt
- G06 - COMPUTING CALCULATING COUNTING

Joshua J. O'Brien

Person

Patents Grantslast 30 patents

Integrated communication link testing

Multi-mode measurement probe

Protocol aware oscilloscope for busses with sideband and control si...

Test and measurement instrument accessory with reconfigurable proce...

Integrated communication link testing

Test and measurement devices, systems and methods associated with a...

Systems and methods for synchronizing multiple test and measurement...

Test and measurement devices, systems, and methods associated with...

Categorization of acquired data based on explicit and implicit means

Integrated communication link testing

Systems and methods for synchronizing multiple test and measurement...

Analog transitional storage

Slot interposer probe

Patents Applicationslast 30 patents

INTERLEAVED DIGITAL TRIGGER CORRECTION

SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POW...

SPLIT-PATH MULTIPLEXING ACCESSORY FOR A TEST AND MEASUREMENT INSTRU...

TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...

INTEGRATED COMMUNICATION LINK TESTING

PARALLEL TRIGGER PATHS IN A TEST AND MEASUREMENT INSTRUMENT

MULTIPLE SAMPLE-RATE DATA CONVERTER

MULTI-MODE MEASUREMENT PROBE

TEST AND MEASUREMENT DEVICES, SYSTEMS AND METHODS ASSOCIATED WITH A...

AUTOMATIC RECOMMENDATION OF FEATURE UPGRADES IN A TEST AND MEASUREM...

TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...

INTEGRATED COMMUNICATION LINK TESTING

SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...

PROTOCOL AWARE OSCILLOSCOPE FOR BUSSES WITH SIDEBAND AND CONTROL SI...

SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...

TEST AND MEASUREMENT DEVICES, SYSTEMS, AND METHODS ASSOCIATED WITH...

CATEGORIZATION OF ACQUIRED DATA BASED ON EXPLICIT AND IMPLICIT MEANS

INTEGRATED COMMUNICATION LINK TESTING

ANALOG TRANSITIONAL STORAGE

SLOT INTERPOSER PROBE