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Joshua W. KEVEK
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Portland, OR, US
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last 30 patents
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Patent Application
FAULT ISOLATION VIA ELECTRON PHOTOEMISSION MICROSCOPY
Publication number
20240272412
Publication date
Aug 15, 2024
Intel Corporation
Joshua KEVEK
G02 - OPTICS
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Patent Application
ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...
Publication number
20240219460
Publication date
Jul 4, 2024
Xianghong TONG
G01 - MEASURING TESTING
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Patent Application
TESTING A SEMICONDUCTOR DEVICE USING X-RAYS
Publication number
20240103072
Publication date
Mar 28, 2024
Intel Corporation
Patrick PARDY
G01 - MEASURING TESTING