Josiah A. Bartlett

Person

Forest Grove, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-mode measurement probe
- Patent number 12,210,039
- Issue date Jan 28, 2025
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Grant
Multi-user test instrument
- Patent number 12,038,456
- Issue date Jul 16, 2024
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument accessory with reconfigurable proce...
- Patent number 11,815,548
- Issue date Nov 14, 2023
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Grant
Multi-segmented Rogowski-coil current sensor
- Patent number 11,733,271
- Issue date Aug 22, 2023
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement probe having a touchscreen
- Patent number 11,719,721
- Issue date Aug 8, 2023
- Tektronix, Inc.
- Karl A. Rinder
- G01 - MEASURING TESTING
Information Patent Grant
Frequency converter accessory for a test and measurement instrument
- Patent number 11,619,657
- Issue date Apr 4, 2023
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Resistive test-probe tips
- Patent number 11,079,408
- Issue date Aug 3, 2021
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Contactless coupling between test and measurement system and a devi...
- Patent number 11,041,880
- Issue date Jun 22, 2021
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Position sensing in a probe to modify transfer characteristics in a...
- Patent number 10,962,566
- Issue date Mar 30, 2021
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Position sensing in a probe to modify transfer characteristics in a...
- Patent number 10,215,776
- Issue date Feb 26, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Virtual model adapter removal and substitution technique for cascad...
- Patent number 9,581,675
- Issue date Feb 28, 2017
- Tektronix, Inc.
- Laudie J. Doubrava
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,810,258
- Issue date Aug 19, 2014
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having a compensation digital filter
- Patent number 8,791,706
- Issue date Jul 29, 2014
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,723,530
- Issue date May 13, 2014
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Wideband balun structure
- Patent number 8,611,436
- Issue date Dec 17, 2013
- Tektronix, Inc.
- Daniel G. Knierim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,564,308
- Issue date Oct 22, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having probe cable termination in a signa...
- Patent number 8,456,173
- Issue date Jun 4, 2013
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,436,624
- Issue date May 7, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having a compensation digital filter
- Patent number 8,278,940
- Issue date Oct 2, 2012
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument and method for providing post-acqui...
- Patent number 8,024,141
- Issue date Sep 20, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END
- Publication number 20240353447
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...
- Publication number 20240069094
- Publication date Feb 29, 2024
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Application
COMBINED SHUNT AND MULTI-SEGMENTED ROGOWSKI-COIL CURRENT SENSOR
- Publication number 20230417800
- Publication date Dec 28, 2023
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
MULTI-INPUT REMOTE HEADS FOR SEQUENTIAL TESTING
- Publication number 20220390513
- Publication date Dec 8, 2022
- Tektronix, Inc.
- Shane A. Hazzard
- G01 - MEASURING TESTING
Information Patent Application
ISOLATED PROBE TIP
- Publication number 20220349917
- Publication date Nov 3, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTI-MODE MEASUREMENT PROBE
- Publication number 20220334144
- Publication date Oct 20, 2022
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Application
MULTI-USER TEST INSTRUMENT
- Publication number 20220137091
- Publication date May 5, 2022
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SEGMENTED ROGOWSKI-COIL CURRENT SENSOR
- Publication number 20220099706
- Publication date Mar 31, 2022
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...
- Publication number 20220018896
- Publication date Jan 20, 2022
- Tektronix, Inc.
- Charles W. Case
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SHUNT PROBE
- Publication number 20210318361
- Publication date Oct 14, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
Test and Measurement Probe Having a Touchscreen
- Publication number 20210263074
- Publication date Aug 26, 2021
- Tektronix, Inc.
- Karl A. Rinder
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT
- Publication number 20210148951
- Publication date May 20, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
Resistive Test-Probe Tips
- Publication number 20190353683
- Publication date Nov 21, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Test and Measurement Probe Coupler
- Publication number 20190170790
- Publication date Jun 6, 2019
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Position Sensing in a Probe to Modify Transfer Characteristics in a...
- Publication number 20170115325
- Publication date Apr 27, 2017
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL MODEL ADAPTER REMOVAL AND SUBSTITUTION TECHNIQUE FOR CASCAD...
- Publication number 20140058693
- Publication date Feb 27, 2014
- Tektronix, Inc.
- Laudie J. Doubrava
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT AND METHOD FOR PROVIDING POST-ACQUI...
- Publication number 20130245977
- Publication date Sep 19, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ACQUISITION SYSTEM HAVING REDUCED PROBE LOADING OF A DEVICE...
- Publication number 20130221985
- Publication date Aug 29, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having Reduced Probe Loading of a Device...
- Publication number 20130134999
- Publication date May 30, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Wideband Balun Structure
- Publication number 20130022133
- Publication date Jan 24, 2013
- Tektronix, Inc.
- Daniel G. Knierim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Signal Acquisition System Having a Compensation Digital Filter
- Publication number 20120268140
- Publication date Oct 25, 2012
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having a Compensation Digital Filter
- Publication number 20110074391
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Low Capacitance Signal Acquisition System
- Publication number 20110074441
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having Reduced Probe Loading of a Device...
- Publication number 20110074392
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having Probe Cable Termination in a Signa...
- Publication number 20110074389
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having Reduced Probe Loading of a Device...
- Publication number 20110074390
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Test and Measurement Instrument and Method For Providing Post-Acqui...
- Publication number 20110060540
- Publication date Mar 10, 2011
- Tektronix, Inc.
- Josiah A. BARTLETT
- G01 - MEASURING TESTING
Information Patent Application
Test and Measurement Instrument and Method For Providing Post-Acqui...
- Publication number 20110060541
- Publication date Mar 10, 2011
- Tektronix, Inc.
- Josiah A. BARTLETT
- G01 - MEASURING TESTING

Josiah A. Bartlett

Person

Patents Grantslast 30 patents

Multi-mode measurement probe

Multi-user test instrument

Test and measurement instrument accessory with reconfigurable proce...

Multi-segmented Rogowski-coil current sensor

Test and measurement probe having a touchscreen

Frequency converter accessory for a test and measurement instrument

Resistive test-probe tips

Contactless coupling between test and measurement system and a devi...

Position sensing in a probe to modify transfer characteristics in a...

Position sensing in a probe to modify transfer characteristics in a...

Virtual model adapter removal and substitution technique for cascad...

Signal acquisition system having reduced probe loading of a device...

Signal acquisition system having a compensation digital filter

Signal acquisition system having reduced probe loading of a device...

Wideband balun structure

Signal acquisition system having reduced probe loading of a device...

Signal acquisition system having probe cable termination in a signa...

Signal acquisition system having reduced probe loading of a device...

Signal acquisition system having a compensation digital filter

Test and measurement instrument and method for providing post-acqui...

Patents Applicationslast 30 patents

TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END

TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...

COMBINED SHUNT AND MULTI-SEGMENTED ROGOWSKI-COIL CURRENT SENSOR

MULTI-INPUT REMOTE HEADS FOR SEQUENTIAL TESTING

ISOLATED PROBE TIP

MULTI-MODE MEASUREMENT PROBE

MULTI-USER TEST INSTRUMENT

MULTI-SEGMENTED ROGOWSKI-COIL CURRENT SENSOR

TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCE...

CURRENT SHUNT PROBE

Test and Measurement Probe Having a Touchscreen

FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT

Resistive Test-Probe Tips

Test and Measurement Probe Coupler

Position Sensing in a Probe to Modify Transfer Characteristics in a...

VIRTUAL MODEL ADAPTER REMOVAL AND SUBSTITUTION TECHNIQUE FOR CASCAD...

TEST AND MEASUREMENT INSTRUMENT AND METHOD FOR PROVIDING POST-ACQUI...

SIGNAL ACQUISITION SYSTEM HAVING REDUCED PROBE LOADING OF A DEVICE...

Signal Acquisition System Having Reduced Probe Loading of a Device...

Wideband Balun Structure

Signal Acquisition System Having a Compensation Digital Filter

Signal Acquisition System Having a Compensation Digital Filter

Low Capacitance Signal Acquisition System

Signal Acquisition System Having Reduced Probe Loading of a Device...

Signal Acquisition System Having Probe Cable Termination in a Signa...

Signal Acquisition System Having Reduced Probe Loading of a Device...

Test and Measurement Instrument and Method For Providing Post-Acqui...

Test and Measurement Instrument and Method For Providing Post-Acqui...