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Jou KUDOU
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Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and electronic control device
Patent number
9,461,663
Issue date
Oct 4, 2016
Renesas Electronics Corporation
Masumi Kon
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and electronic control device
Patent number
9,077,357
Issue date
Jul 7, 2015
Renesas Electronics Corporation
Masumi Kon
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Impedance detection circuit and adjustment method of impedance dete...
Patent number
8,525,529
Issue date
Sep 3, 2013
Renesas Electronics Corporation
Yoshiaki Ishizeki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE AND ELECTRONIC CONTROL DEVICE
Publication number
20150263752
Publication date
Sep 17, 2015
RENESAS ELECTRONICS CORPORATION
Masumi KON
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND ELECTRONIC CONTROL DEVICE
Publication number
20150109155
Publication date
Apr 23, 2015
RENESAS ELECTRONICS CORPORATION
Masumi KON
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
IMPEDANCE DETECTION CIRCUIT AND ADJUSTMENT METHOD OF IMPEDANCE DETE...
Publication number
20110285407
Publication date
Nov 24, 2011
RENESAS ELECTRONICS CORPORATION
Yoshiaki ISHIZEKI
G01 - MEASURING TESTING