Jouke KRIST

Follow

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining lithographic quality of a stru...
- Patent number 9,518,936
- Issue date Dec 13, 2016
- ASML Netherlands B.V.
- Willem Jan Grootjans
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of optimizing a model, a method of measuring a property, a d...
- Patent number 8,868,387
- Issue date Oct 21, 2014
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Determining Lithographic Quality of a Stru...
- Publication number 20150308966
- Publication date Oct 29, 2015
- ASML Nertherlands B.V
- Willem Jan GROOTJANS
- G01 - MEASURING TESTING
Information Patent Application
Method of Optimizing a Model, a Method of Measuring a Property, A D...
- Publication number 20090094005
- Publication date Apr 9, 2009
- ASML NETHERLANDS B.V.
- Arie Jeffrey DEN BOEF
- G06 - COMPUTING CALCULATING COUNTING