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Joyce S. Obey Hewett
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Austin, TX, US
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last 30 patents
Information
Patent Grant
Optimizing critical dimension uniformity utilizing a resist bake pl...
Patent number
7,334,202
Issue date
Feb 19, 2008
Advanced Micro Devices, Inc.
Bhanwar Singh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for performing field-to-field compensation
Patent number
7,120,514
Issue date
Oct 10, 2006
Advanced Micro Devices, Inc.
Christopher A. Bode
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for initializing tool controllers based on too...
Patent number
7,103,439
Issue date
Sep 5, 2006
Advanced Micro Devices, Inc.
Christopher A. Bode
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Method and apparatus for controlling a thickness of a conductive la...
Patent number
6,969,672
Issue date
Nov 29, 2005
Advanced Micro Devices, Inc.
Joyce S. Obey Hewett
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for updating control state variables of a proc...
Patent number
6,970,757
Issue date
Nov 29, 2005
Advanced Micro Devices, Inc.
Joyce S. Oey Hewett
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Method and apparatus for controlling process target values based on...
Patent number
6,937,914
Issue date
Aug 30, 2005
Advanced Micro Devices, Inc.
Christopher A. Bode
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Method and apparatus for distinguishing between sources of process...
Patent number
6,901,340
Issue date
May 31, 2005
Advanced Micro Devices, Inc.
Alexander J. Pasadyn
H01 - BASIC ELECTRIC ELEMENTS