Jr-Wei Ye

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Erlin Township, TW

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Patents Grantslast 30 patents

Information Patent Grant
Photoresist coating scheme
- Patent number 9,720,325
- Issue date Aug 1, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Hsien Hsu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automated wafer inspection
- Patent number 9,575,012
- Issue date Feb 21, 2017
- Taiwan Semiconductor Manufacturing Company Limited
- Hu-Wei Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Photoresist Coating Scheme
- Publication number 20150079806
- Publication date Mar 19, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chih-Hsien Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED WAFER INSPECTION
- Publication number 20140267692
- Publication date Sep 18, 2014
- Taiwan Semiconductor Manufacturing Company Limited
- Lin Hu-Wei
- G01 - MEASURING TESTING