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Jörg Müller
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Sandersdorf, DE
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last 30 patents
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Patent Grant
Method and device for characterizing wafers during the production o...
Patent number
8,679,361
Issue date
Mar 25, 2014
Q-Cells SE
Jörg Müller
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD FOR THE CONTACT SEPARATION OF ELECTRICALLY-CONDUCTING LAYERS...
Publication number
20140087515
Publication date
Mar 27, 2014
INSTITUT FUR SOLARENERGIEFORSCHUNG GMBH
Andreas Teppe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR THE CONTACT SEPARATION OF ELECTRICALLY-CONDUCTING LAYERS...
Publication number
20110053312
Publication date
Mar 3, 2011
Institut Fuer Solarenergieforschung GmbH
Andreas Teppe
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
METHOD AND DEVICE FOR CHARACTERIZING WAFERS DURING THE PRODUCTION O...
Publication number
20080087643
Publication date
Apr 17, 2008
Q-CELLS AG
Jorg Muller
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Method for the Contact Separation of Electrically-Conducting Layers...
Publication number
20080035198
Publication date
Feb 14, 2008
INSTITUT FUR SOLARENERGIEFORSCHUNG GMBH
Andreas Teppe
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...