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Jörg-Thomas Zettler
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Berlin, DE
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for real-time determination of spherical and n...
Patent number
8,810,798
Issue date
Aug 19, 2014
Laytec AG
Jorg-Thomas Zettler
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for the determination of characteristic layer...
Patent number
7,283,218
Issue date
Oct 16, 2007
Laytec Gesellschaft Für In-Situ und Nano-Sensorik mbH
Jörg-Thomas Zettler
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Method and apparatus for real-time determination of spherical and n...
Publication number
20130021610
Publication date
Jan 24, 2013
LayTec AG
Jörg-Thomas Zettler
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for the determination of characteristic layer...
Publication number
20040263867
Publication date
Dec 30, 2004
Jorg-Thomas Zettler
G01 - MEASURING TESTING
Information
Patent Application
Method for measuring characteristics, especially the temperature of...
Publication number
20020113971
Publication date
Aug 22, 2002
LayTec Gesellschaft fur in-situ und nano-Sensork mbH
Jorg-Thomas Zettler
G01 - MEASURING TESTING