Jürgen Lindolf

Person

Friedburg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with electrostatic discharge protection
- Patent number 7,317,603
- Issue date Jan 8, 2008
- Infineon Technologies, AG
- Helmut Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated semiconductor circuit with an electrically programmable...
- Patent number 7,126,204
- Issue date Oct 24, 2006
- Infineon Technologies AG
- Ulrich Frey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing an antifuse in a substrate and an antifuse str...
- Patent number 6,919,234
- Issue date Jul 19, 2005
- Infineon Technologies AG
- Jürgen Lindolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and test structure for determining resistances at a pluralit...
- Patent number 6,917,208
- Issue date Jul 12, 2005
- Infineon Technologies AG
- Jürgen Lindolf
- G11 - INFORMATION STORAGE
Information Patent Grant
Transistor array and semiconductor memory configuration fabricated...
- Patent number 6,838,724
- Issue date Jan 4, 2005
- Infineon Technologies AG
- Bernhard Kowalski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having a programmable element and method of oper...
- Patent number 6,788,129
- Issue date Sep 7, 2004
- Infineon Technologies AG
- Jörg Peter
- G11 - INFORMATION STORAGE
Information Patent Grant
Transistor configuration for a bandgap circuit
- Patent number 6,768,139
- Issue date Jul 27, 2004
- Infineon Technologies AG
- Helmut Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuse for a semiconductor configuration and method for its production
- Patent number 6,756,655
- Issue date Jun 29, 2004
- Infineon Technologies AG
- Thoai-Thai Le
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated dynamic memory and method for operating it
- Patent number 6,721,215
- Issue date Apr 13, 2004
- Infineon Technologies AG
- Thoai-Thai Le
- G11 - INFORMATION STORAGE
Information Patent Grant
Vertical field effect transistor with internal annular gate and met...
- Patent number 6,717,200
- Issue date Apr 6, 2004
- Siemens Aktiengesellschaft
- Florian Schamberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit configuration and method for determining a time constant of...
- Patent number 6,600,680
- Issue date Jul 29, 2003
- Infineon Technologies AG
- Bernhard Sell
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of reading electrical fuses/antifuses
- Patent number 6,552,549
- Issue date Apr 22, 2003
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit configuration for measuring the capacitance of structures i...
- Patent number 6,501,283
- Issue date Dec 31, 2002
- Infineon Technologies AG
- Jürgen Lindolf
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating an integrated circuit, in particular an anti...
- Patent number 6,458,631
- Issue date Oct 1, 2002
- Infineon Technologies AG
- Axel Brintzinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit configuration for switching over a receiver circuit in part...
- Patent number 6,456,553
- Issue date Sep 24, 2002
- Infineon Technologies AG
- Eckhard Brass
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor circuit configuration
- Patent number 6,449,206
- Issue date Sep 10, 2002
- Infineon Technologies AG
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for carrying out a burn-in process for electrically stressin...
- Patent number 6,445,630
- Issue date Sep 3, 2002
- Infineon Technologies AG
- Kamel Ayadi
- G11 - INFORMATION STORAGE
Information Patent Grant
Connection element in an integrated circuit having a layer structur...
- Patent number 6,429,503
- Issue date Aug 6, 2002
- Infineon Technologies AG
- Matthias Uwe Lehr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sense amplifier configuration having a field-effect transistor havi...
- Patent number 6,417,722
- Issue date Jul 9, 2002
- Infineon Technologies AG
- Helmut Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated semiconductor memory
- Patent number 6,125,073
- Issue date Sep 26, 2000
- Siemens Aktiengesellschaft
- Thoai-Thai Le
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Integrated circuit with electrostatic discharge protection
- Publication number 20060232897
- Publication date Oct 19, 2006
- Helmut Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD protection apparatus
- Publication number 20050099745
- Publication date May 12, 2005
- Helmut Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated semiconductor circuit with an electrically programmable...
- Publication number 20050073024
- Publication date Apr 7, 2005
- Ulrich Frey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for producing an antifuse structure and antifuse
- Publication number 20050023637
- Publication date Feb 3, 2005
- Jurgen Lindolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for producing an antifuse in a substrate and an antifuse str...
- Publication number 20050003647
- Publication date Jan 6, 2005
- Jurgen Lindolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transistor array and semiconductor memory configuration fabricated...
- Publication number 20040104418
- Publication date Jun 3, 2004
- Bernhard Kowalski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and test structure for determining resistances at a pluralit...
- Publication number 20030189436
- Publication date Oct 9, 2003
- Jurgen Lindolf
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit having a programmable element and method of oper...
- Publication number 20030094996
- Publication date May 22, 2003
- Jorg Peter
- G11 - INFORMATION STORAGE
Information Patent Application
Transistor configuration for a bandgap circuit
- Publication number 20030030128
- Publication date Feb 13, 2003
- Helmut Fischer
- G05 - CONTROLLING REGULATING
Information Patent Application
Circuit configuration and method for determining a time constant of...
- Publication number 20030001185
- Publication date Jan 2, 2003
- Bernhard Sell
- G01 - MEASURING TESTING
Information Patent Application
Integrated dynamic memory and method for operating it
- Publication number 20030002363
- Publication date Jan 2, 2003
- Thoai-Thai Le
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR FABRICATING AN INTEGRATED CIRCUIT, IN PARTICULAR AN ANTI...
- Publication number 20020155678
- Publication date Oct 24, 2002
- Axel Brintzinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuse for a semiconductor configuration and method for its production
- Publication number 20020084508
- Publication date Jul 4, 2002
- Thoai-Thai Le
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit configuration for switching over a receiver circuit in part...
- Publication number 20020053944
- Publication date May 9, 2002
- Eckhard Brass
- G11 - INFORMATION STORAGE
Information Patent Application
Connection element
- Publication number 20020005586
- Publication date Jan 17, 2002
- Matthias Uwe Lehr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor circuit configuration
- Publication number 20010050416
- Publication date Dec 13, 2001
- Robert Kaiser
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit configuration for measuring the capacitance of structures i...
- Publication number 20010033177
- Publication date Oct 25, 2001
- Jurgen Lindolf
- G01 - MEASURING TESTING
Information Patent Application
Method for carrying out a burn-in process for electrically stressin...
- Publication number 20010033518
- Publication date Oct 25, 2001
- Kamel Ayadi
- G11 - INFORMATION STORAGE

Jürgen Lindolf

Person

Patents Grantslast 30 patents

Integrated circuit with electrostatic discharge protection

Integrated semiconductor circuit with an electrically programmable...

Method for producing an antifuse in a substrate and an antifuse str...

Method and test structure for determining resistances at a pluralit...

Transistor array and semiconductor memory configuration fabricated...

Integrated circuit having a programmable element and method of oper...

Transistor configuration for a bandgap circuit

Fuse for a semiconductor configuration and method for its production

Integrated dynamic memory and method for operating it

Vertical field effect transistor with internal annular gate and met...

Circuit configuration and method for determining a time constant of...

Method of reading electrical fuses/antifuses

Circuit configuration for measuring the capacitance of structures i...

Method for fabricating an integrated circuit, in particular an anti...

Circuit configuration for switching over a receiver circuit in part...

Semiconductor circuit configuration

Method for carrying out a burn-in process for electrically stressin...

Connection element in an integrated circuit having a layer structur...

Sense amplifier configuration having a field-effect transistor havi...

Integrated semiconductor memory

Patents Applicationslast 30 patents

Integrated circuit with electrostatic discharge protection

ESD protection apparatus

Integrated semiconductor circuit with an electrically programmable...

Method for producing an antifuse structure and antifuse

Method for producing an antifuse in a substrate and an antifuse str...

Transistor array and semiconductor memory configuration fabricated...

Method and test structure for determining resistances at a pluralit...

Integrated circuit having a programmable element and method of oper...

Transistor configuration for a bandgap circuit

Circuit configuration and method for determining a time constant of...

Integrated dynamic memory and method for operating it

METHOD FOR FABRICATING AN INTEGRATED CIRCUIT, IN PARTICULAR AN ANTI...

Fuse for a semiconductor configuration and method for its production

Circuit configuration for switching over a receiver circuit in part...

Connection element

Semiconductor circuit configuration

Circuit configuration for measuring the capacitance of structures i...

Method for carrying out a burn-in process for electrically stressin...