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Ju Hao CHIEN
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New Taipei City, TW
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last 30 patents
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Patent Grant
Defect displaying method
Patent number
11,416,979
Issue date
Aug 16, 2022
ASML Netherlands B.V.
Wei Fang
G06 - COMPUTING CALCULATING COUNTING
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last 30 patents
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Patent Application
DEFECT DISPLAYING METHOD
Publication number
20190370950
Publication date
Dec 5, 2019
ASML Netherlands B,V.
Wei FANG
G06 - COMPUTING CALCULATING COUNTING