Ju Hwan Yoo

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Chungnam, KR

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Patents Grantslast 30 patents

Information Patent Grant
Test section unit, test head and electronic device testing apparatus
- Patent number 8,314,630
- Issue date Nov 20, 2012
- Advantest Corporation
- Toru Murakami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test section unit, test head and electronic device testing apparatus
- Publication number 20100213959
- Publication date Aug 26, 2010
- Advantest Corporation
- Toru Murakami
- G01 - MEASURING TESTING