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Juan-Antonio OCON-GARRIDO
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Munich, DE
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last 30 patents
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Patent Grant
Overheat protection circuit and method in an accelerated aging test...
Patent number
10,371,745
Issue date
Aug 6, 2019
Micron Technology, Inc.
Ronny Schneider
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
OVERHEAT PROTECTION CIRCUIT AND METHOD IN AN ACCELERATED AGING TEST...
Publication number
20150204941
Publication date
Jul 23, 2015
Micron Technology, Inc.
Ronny SCHNEIDER
G01 - MEASURING TESTING