Juan C. Martinez

Person

  • Houston, TX, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device testing

    • Patent number 7,446,552
    • Issue date Nov 4, 2008
    • Texas Instruments Incorporated
    • Francisco Cano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device testing

    • Patent number 7,446,553
    • Issue date Nov 4, 2008
    • Texas Instruments Incorporated
    • Francisco Cano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device testing

    • Patent number 7,382,147
    • Issue date Jun 3, 2008
    • Texas Instruments Incorporated
    • Francisco Cano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device testing

    • Patent number 7,365,556
    • Issue date Apr 29, 2008
    • Texas Instruments Incorporated
    • Francisco Cano
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Secure operating system loader

    • Publication number 20080222718
    • Publication date Sep 11, 2008
    • Juan I. Martinez
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Semiconductor Device Testing

    • Publication number 20070285104
    • Publication date Dec 13, 2007
    • Francisco Cano
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor Device Testing

    • Publication number 20070162808
    • Publication date Jul 12, 2007
    • Francisco Cano
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor Device Testing

    • Publication number 20070145999
    • Publication date Jun 28, 2007
    • Francisco Cano
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor device testing

    • Publication number 20060044001
    • Publication date Mar 2, 2006
    • Francisco Cano
    • G01 - MEASURING TESTING