Juan Felipe TORRES

Follow

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for detecting faults in multilayer semiconductors
- Patent number 10,088,522
- Issue date Oct 2, 2018
- TOSHIBA MEMORY CORPORATION
- Juan Felipe Torres
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THERMAL LASER STIMULATION APPARATUS, METHOD OF THERMALLY STIMULATIN...
- Publication number 20170269154
- Publication date Sep 21, 2017
- KABUSHIKI KAISHA TOSHIBA
- Juan Felipe TORRES
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTING FAULTS IN MULTILAYER SEMICONDUCTORS
- Publication number 20170074928
- Publication date Mar 16, 2017
- KABUSHIKI KAISHA TOSHIBA
- Juan Felipe TORRES
- G01 - MEASURING TESTING