Juan Ivaldi

Follow

Person

Bridgeport, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for identifying etch end points in semiconductor...
- Patent number 6,381,008
- Issue date Apr 30, 2002
- SD Acquisition Inc.
- Wayne A. Branagh
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing spectrometric data
- Patent number 6,029,115
- Issue date Feb 22, 2000
- Perkin Elmer LLC
- David H. Tracy
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for comparing spectra
- Patent number 5,308,982
- Issue date May 3, 1994
- Perkin-Elmer Corporation
- Juan Ivaldi
- G01 - MEASURING TESTING