Juan P. Carrejo

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Tempe, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of forming a probe for an atomic force microscope
- Patent number 5,388,323
- Issue date Feb 14, 1995
- Motorola, Inc.
- Theresa J. Hopson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for providing surface images
- Patent number 5,356,218
- Issue date Oct 18, 1994
- Motorola, Inc.
- Theresa J. Hopson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring the topography of a semiconducto...
- Patent number 5,338,932
- Issue date Aug 16, 1994
- Motorola, Inc.
- N. David Theodore
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transmission electron microscope environmental specimen holder
- Patent number 5,326,971
- Issue date Jul 5, 1994
- Motorola, Inc.
- N. David Theodore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-dimensional high-resolution probe for semiconductor measureme...
- Patent number 5,214,389
- Issue date May 25, 1993
- Motorola, Inc.
- Beatrice M. Cao
- G01 - MEASURING TESTING