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Juan Valdivia
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for etching features using a targeted deposition for selecti...
Patent number
12,217,955
Issue date
Feb 4, 2025
Lam Research Corporation
Wenchi Liu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
System and method for determining field non-uniformities of a wafer...
Patent number
10,763,142
Issue date
Sep 1, 2020
Lam Research Corporation
Marcus Musselman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Aspect ratio adjustment of mask pattern using trimming to alter geo...
Patent number
8,394,723
Issue date
Mar 12, 2013
Lam Research Corporation
Juan Valdivia
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR ETCHING FEATURES USING A TARGETED DEPOSITION FOR SELECTI...
Publication number
20250149330
Publication date
May 8, 2025
LAM RESEARCH CORPORATION
Wenchi LIU
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METHOD FOR ETCHING FEATURES USING A TARGETED DEPOSITION FOR SELECTI...
Publication number
20220301853
Publication date
Sep 22, 2022
LAM RESEARCH CORPORATION
Wenchi LIU
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
IN SITU INVERSE MASK PATTERNING
Publication number
20210020441
Publication date
Jan 21, 2021
LAM RESEARCH CORPORATION
Juan VALDIVIA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING FIELD NON-UNIFORMITIES OF A WAFER...
Publication number
20160370796
Publication date
Dec 22, 2016
LAM RESEARCH CORPORATION
Marcus Musselman
G05 - CONTROLLING REGULATING
Information
Patent Application
ASPECT RATIO ADJUSTMENT OF MASK PATTERN USING TRIMMING TO ALTER GEO...
Publication number
20110163420
Publication date
Jul 7, 2011
LAM RESEARCH CORPORATION
Juan Valdivia
H01 - BASIC ELECTRIC ELEMENTS