Juergen Fink

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Elcheshein-Illingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
X-ray micro diffractometer sample positioner
- Patent number 5,359,640
- Issue date Oct 25, 1994
- Siemens Industrial Automation, Inc.
- Juergen Fink
- G01 - MEASURING TESTING