Juergen Frosien

Person

Berlin, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Particle beam measuring method for non-contact testing of interconn...
- Patent number 4,985,681
- Issue date Jan 15, 1991
- Siemens Aktiengesellschaft
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Grant
Detector objective for particle beam apparatus
- Patent number 4,831,266
- Issue date May 16, 1989
- Siemens Aktiengesellschaft
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer objective for particle beam measuring instruments
- Patent number 4,812,651
- Issue date Mar 14, 1989
- Siemens Aktiengesellschaft
- Hans-Peter Feuerbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer objective for electron beam mensuration techniques
- Patent number 4,808,821
- Issue date Feb 28, 1989
- Siemens Aktiengesellschaft
- Hans-Peter Feuerbaum
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic-magnetic lens for particle beam apparatus
- Patent number 4,785,176
- Issue date Nov 15, 1988
- Siemens Aktiengesellschaft
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning particle microscope
- Patent number 4,713,543
- Issue date Dec 15, 1987
- Siemens Aktiengesellschaft
- Hans-Peter Feuerbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for measuring lengths in a scanning particle m...
- Patent number 4,677,296
- Issue date Jun 30, 1987
- Siemens Aktiengesellschaft
- Burkhard Lischke
- G01 - MEASURING TESTING
Information Patent Grant
Scanning particle microscope with diminished boersch effect
- Patent number 4,675,524
- Issue date Jun 23, 1987
- Siemens Aktiengesellschaft
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-optical system with variable-shaped beam for generating an...
- Patent number 4,514,638
- Issue date Apr 30, 1985
- Siemens Aktiengesellschaft
- Burkhard Lischke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High current electron source
- Patent number 4,393,308
- Issue date Jul 12, 1983
- Siemens Aktiengesellschaft
- Klaus Anger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for the rapid deflection of a particle beam
- Patent number 4,335,309
- Issue date Jun 15, 1982
- Siemens Aktiengesellschaft
- Klaus Anger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for setting and correcting errors of an electron...
- Patent number 4,238,680
- Issue date Dec 9, 1980
- Siemens Aktiengesellschaft
- Klaus Anger
- H01 - BASIC ELECTRIC ELEMENTS

Juergen Frosien

Person

Patents Grantslast 30 patents

Particle beam measuring method for non-contact testing of interconn...

Detector objective for particle beam apparatus

Spectrometer objective for particle beam measuring instruments

Spectrometer objective for electron beam mensuration techniques

Electrostatic-magnetic lens for particle beam apparatus

Scanning particle microscope

Apparatus and method for measuring lengths in a scanning particle m...

Scanning particle microscope with diminished boersch effect

Electron-optical system with variable-shaped beam for generating an...

High current electron source

Method and device for the rapid deflection of a particle beam

Method and device for setting and correcting errors of an electron...